Isawa; Miki

Patent Applications and Registrations

Patent applications and USPTO patent grants for Isawa; Miki.The latest application filed is for "pattern evaluation device".

Company Profile

4.12.12

Isawa; Miki - Tokyo JP
Isawa; Miki - Hitachinaka JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Pattern evaluation device Grant 10,854,420 - Isawa , et al. December 1, 2	2020-12-01
Image processor, method for generating pattern using self-organizing lithographic techniques and computer program Grant 10,732,512 - Sutani , et al.	2020-08-04
Pattern Evaluation Device App 20200098543 - ISAWA; Miki ; et al.	2020-03-26
Pattern measurement device, and computer program for measuring pattern Grant 10,545,018 - Yamaguchi , et al. Ja	2020-01-28
Image Processor, Method for Generating Pattern Using Self-Organizing Lithographic Techniques and Computer Program App 20180181009 - SUTANI; Takumichi ; et al.	2018-06-28
Method for pattern measurement, method for setting device parameters of charged particle radiation device, and charged particle radiation device Grant 9,831,062 - Suzuki , et al. November 28, 2	2017-11-28
Pattern measurement device and computer program for evaluating patterns based on centroids of the patterns Grant 9,804,107 - Sugiyama , et al. October 31, 2	2017-10-31
Charged particle beam device Grant 9,627,171 - Makino , et al. April 18, 2	2017-04-18
Pattern measurement device, evaluation method of polymer compounds used in self-assembly lithography, and computer program Grant 9,589,343 - Isawa , et al. March 7, 2	2017-03-07
Charged particle beam apparatus Grant 9,502,212 - Mizuhara , et al. November 22, 2	2016-11-22
Pattern Measurement Device, and Computer Program for Measuring Pattern App 20160320182 - YAMAGUCHI; Satoru ; et al.	2016-11-03
Pattern Measurement Device and Computer Program App 20160313266 - SUGIYAMA; Akiyuki ; et al.	2016-10-27
Scanning electron microscope Grant 9,472,376 - Yokosuka , et al. October 18, 2	2016-10-18
Method for Pattern Measurement, Method for Setting Device Parameters of Charged Particle Radiation Device, and Charged Particle Radiation Device App 20150357158 - SUZUKI; Makoto ; et al.	2015-12-10
Charged Particle Beam Device App 20150357153 - MAKINO; Hiroshi ; et al.	2015-12-10
Charged Particle Beam Apparatus App 20150348748 - MIZUHARA; Yuzuru ; et al.	2015-12-03
Image Processor, Method For Generating Pattern Using Self- Organizing Lithographic Techniques And Computer Program App 20150277237 - Sutani; Takumichi ; et al.	2015-10-01
Pattern Measurement Device, Evaluation Method of Polymer Compounds Used in Self-Assembly Lithography, and Computer Program App 20150243008 - Isawa; Miki ; et al.	2015-08-27
Pattern measuring apparatus and computer program Grant 9,000,365 - Mochizuki , et al. April 7, 2	2015-04-07
Scanning Electron Microscope App 20150008322 - Yokosuka; Toshiyuki ; et al.	2015-01-08
Charged particle beam apparatus Grant 8,648,300 - Isawa , et al. February 11, 2	2014-02-11
Charged Particle Beam Apparatus App 20140014836 - ISAWA; Miki ; et al.	2014-01-16
Pattern Measuring Apparatus And Computer Program App 20120037801 - Mochizuki; Yuzuru ; et al.	2012-02-16

uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.

While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.

All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.