Isakozawa; Shigeto

Patent Applications and Registrations

Patent applications and USPTO patent grants for Isakozawa; Shigeto.The latest application filed is for "method and apparatus for observing inside structures, and specimen holder".

Company Profile

0.27.18

Isakozawa; Shigeto - Hitachinaka JP
Isakozawa, Shigeto - Hitachinaka-shi JP
Isakozawa; Shigeto - Katsuta JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Method and apparatus for observing inside structures, and specimen holder Grant 8,134,131 - Terada , et al. March 13, 2	2012-03-13
Element mapping unit, scanning transmission electron microscope, and element mapping method Grant 7,928,376 - Kaji , et al. April 19, 2	2011-04-19
Charged particle beam equipment Grant 7,923,701 - Inada , et al. April 12, 2	2011-04-12
Method and Apparatus for Observing Inside Structures, and Specimen Holder App 20090302234 - Terada; Shohei ; et al.	2009-12-10
Charged particle beam equipment App 20090242794 - Inada; Hiromi ; et al.	2009-10-01
Method and apparatus for observing inside structures, and specimen holder Grant 7,476,872 - Terada , et al. January 13, 2	2009-01-13
Method and apparatus for observing inside structures, and specimen holder Grant 7,462,830 - Terada , et al. December 9, 2	2008-12-09
Charged particle beam equipment Grant 7,375,330 - Inada , et al. May 20, 2	2008-05-20
Charged particle system and a method for measuring image magnification Grant 7,372,047 - Sato , et al. May 13, 2	2008-05-13
Method And Apparatus For Observing Inside Structures, And Specimen Holder App 20070252091 - Terada; Shohei ; et al.	2007-11-01
Energy spectrum measuring apparatus, electron energy loss spectrometer, electron microscope provided therewith, and electron energy loss spectrum measuring method Grant 7,250,601 - Kaji , et al. July 31, 2	2007-07-31
Micro manipulator Grant 7,146,872 - Morita , et al. December 12, 2	2006-12-12
Charged particle beam equipment App 20060219908 - Inada; Hiromi ; et al.	2006-10-05
Energy spectrum measuring apparatus, electron energy loss spectrometer, electron microscope provided therewith, and electron energy loss spectrum measuring method App 20060163479 - Kaji; Kazutoshi ; et al.	2006-07-27
Energy spectrum measuring apparatus, electron energy loss spectrometer, electron microscope provided therewith, and electron energy loss spectrum measuring method Grant 7,067,805 - Kajl , et al. June 27, 2	2006-06-27
Element mapping unit, scanning transmission electron microscope, and element mapping method App 20060011836 - Kaji; Kazutoshi ; et al.	2006-01-19
Charged particle system and a method for measuring image magnification App 20050189501 - Sato, Mitsugu ; et al.	2005-09-01
Ultimate analyzer, scanning transmission electron microscope and ultimate analysis method Grant 6,933,501 - Kaji , et al. August 23, 2	2005-08-23
Electron microscope Grant 6,930,306 - Kaji , et al. August 16, 2	2005-08-16
Method and apparatus for observing inside structures, and specimen holder App 20050061971 - Terada, Shohei ; et al.	2005-03-24
Method and apparatus for observing element distribution Grant 6,855,927 - Taniguchi , et al. February 15, 2	2005-02-15
Method and apparatus for scanning transmission electron microscopy Grant 6,822,233 - Nakamura , et al. November 23, 2	2004-11-23
Electron microscope App 20040188613 - Kaji, Kazutoshi ; et al.	2004-09-30
Energy spectrum measuring apparatus, electron energy loss spectrometer, electron microscope provided therewith, and electron energy loss spectrum measuring method App 20040183011 - Kaji, Kazutoshi ; et al.	2004-09-23
Ultimate analyzer, scanning transmission electron microscope and ultimate analysis method Grant 6,794,648 - Kaji , et al. September 21, 2	2004-09-21
Ultimate analyzer, scanning transmission electron microscope and ultimate analysis method App 20040169143 - Kaji, Kazutoshi ; et al.	2004-09-02
Energy spectrum measuring apparatus, electron energy loss spectrometer, electron microscope provided therewith, and electron energy loss spectrum measuring method Grant 6,703,613 - Kaji , et al. March 9, 2	2004-03-09
Method and apparatus for observing element distribution App 20040000641 - Taniguchi, Yoshifumi ; et al.	2004-01-01
Method and apparatus for scanning transmission electron microscopy App 20030127595 - Nakamura, Kuniyasu ; et al.	2003-07-10
Inspection of circuit patterns for defects and analysis of defects using a charged particle beam Grant 6,566,654 - Funatsu , et al. May 20, 2	2003-05-20
Ultimate analyzer, scanning transmission electron microscope and ultimate analysis method App 20030085356 - Kaji, Kazutoshi ; et al.	2003-05-08
Ultimate analyzer, scanning transmission electron microscope and ultimate analysis method App 20030085350 - Kaji, Kazutoshi ; et al.	2003-05-08
Micro manipulator App 20030056364 - Morita, Kazuhiro ; et al.	2003-03-27
Method and apparatus for scanning transmission electron microscopy Grant 6,531,697 - Nakamura , et al. March 11, 2	2003-03-11
Energy spectrum measuring apparatus, electron energy loss spectrometer, electron microscope provided therewith, and electron energy loss spectrum measuring method App 20020096632 - Kaji, Kazutoshi ; et al.	2002-07-25
Analysis Electron Microscope App 20010045515 - SATO, YUJI ; et al.	2001-11-29
Energy filter and electron microscope equipped with the energy filter Grant 6,150,657 - Kimoto , et al. November 21, 2	2000-11-21
Electron microscope Grant 6,051,834 - Kakibayashi , et al. April 18, 2	2000-04-18
Electron microscope Grant 5,866,905 - Kakibayashi , et al. February 2, 1	1999-02-02
Electron microscope Grant 5,552,602 - Kakibayashi , et al. September 3, 1	1996-09-03
Electron microscope specimen holder Grant 5,367,171 - Aoyama , et al. November 22, 1	1994-11-22
Focusing apparatus used in a transmission electron microscope Grant 4,698,503 - Nomura , et al. October 6, 1	1987-10-06
Focusing device for a television electron microscope Grant 4,680,469 - Nomura , et al. July 14, 1	1987-07-14
Image distortion-free, image rotation-free electron microscope Grant 4,494,000 - Shii , et al. January 15, 1	1985-01-15
Electron beam control device for electron microscopes Grant 4,451,737 - Isakozawa May 29, 1	1984-05-29

uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.

While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.

All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.