Irino; Kiyoshi

Patent Applications and Registrations

Patent applications and USPTO patent grants for Irino; Kiyoshi.The latest application filed is for "method, system and apparatus of inspection".

Company Profile

0.10.9

Irino; Kiyoshi - Kawasaki JP
Irino, Kiyoshi - Kawasaki-shi JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Method, system and apparatus of inspection Grant 7,679,737 - Takahashi , et al. March 16, 2	2010-03-16
Method, System And Apparatus Of Inspection App 20080165352 - TAKAHASHI; Naohiro ; et al.	2008-07-10
Inspecting method, inspecting apparatus, and method of manufacturing semiconductor device Grant 7,340,352 - Takahashi , et al. March 4, 2	2008-03-04
Inspecting method, inspecting apparatus, and method of manufacturing semiconductor device App 20070255513 - Takahashi; Naohiro ; et al.	2007-11-01
Method of fabricating a semiconductor device containing nitrogen in an oxide film Grant 7,005,393 - Irino February 28, 2	2006-02-28
Manufacture method for semiconductor device with patterned film of ZrO.sub.2 or the like Grant 6,998,303 - Sugita , et al. February 14, 2	2006-02-14
Manufacture system for semiconductor device with thin gate insulating film Grant 6,984,267 - Irino , et al. January 10, 2	2006-01-10
Method of fabricating a semiconductor device containing nitrogen in a gate oxide film Grant 6,979,658 - Irino December 27, 2	2005-12-27
Semiconductor device having a high-dielectric gate insulation film and fabrication process thereof Grant 6,894,369 - Irino , et al. May 17, 2	2005-05-17
Semiconductor device and method for fabricating the same Grant 6,780,699 - Tamura , et al. August 24, 2	2004-08-24
Manufacture method for semiconductor device with patterned film of ZrO2 or the like App 20040038555 - Sugita, Yoshihiro ; et al.	2004-02-26
Semiconductor device and method for fabricating the same App 20030168697 - Tamura, Yasuyuki ; et al.	2003-09-11
Manufacture system for semiconductor device with thin gate insulating film App 20030022523 - Irino, Kiyoshi ; et al.	2003-01-30
Semiconductor device and method of fabricating the same App 20030003667 - Morisaki, Yusuke ; et al.	2003-01-02
Manufacture method and system for semiconductor device with thin gate insulating film of oxynitride Grant 6,468,926 - Irino , et al. October 22, 2	2002-10-22
Method of fabricating a semiconductor device containing nitrogen in an oxide film App 20020151099 - Irino, Kiyoshi	2002-10-17
Semiconductor device having a high-dielectric gate insulation film and fabrication process thereof App 20020146916 - Irino, Kiyoshi ; et al.	2002-10-10
Method Of Fabricating A Semiconductor Device Containing Nitrogen In A Gate Oxide Film App 20020052087 - IRINO, KIYOSHI	2002-05-02
Semiconductor memory device containing nitrogen in a gate oxide film Grant 5,990,517 - Irino November 23, 1	1999-11-23

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