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name:-0.0038058757781982
name:-0.0016510486602783
Io; Eiji Patent Filings

Io; Eiji

Patent Applications and Registrations

Patent applications and USPTO patent grants for Io; Eiji.The latest application filed is for "semiconductor device".

Company Profile
0.5.8
  • Io; Eiji - Tokyo JP
  • Io; Eiji - Kanagawa N/A JP
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Semiconductor device
Grant 11,171,086 - Kubo , et al. November 9, 2
2021-11-09
Semiconductor Device
App 20210167012 - KUBO; Shunji ;   et al.
2021-06-03
Nonvolatile semiconductor memory device and manufacturing method therefor
Grant 8,405,140 - Io March 26, 2
2013-03-26
Nonvolatile semiconductor memory with erase gate and its manufacturing method
Grant 8,058,680 - Io November 15, 2
2011-11-15
Nonvolatile semiconductor memory with erase gate and its manufacturing method
App 20090166708 - Io; Eiji
2009-07-02
Nonvolatile semiconductor memory device and manufacturing method therefor
App 20090096015 - Io; Eiji
2009-04-16
Nonvolatile semiconductor device having a memory cells each of which is constituted of a memory transistor and a selection transistor
Grant 6,579,762 - Io June 17, 2
2003-06-17
Element isolating method in semiconductor integrated circuit device, semiconductor integrated circuit device and manufacturing method thereof
App 20020130382 - Shimizu, Masakuni ;   et al.
2002-09-19
Semiconductor Device Having A High Breakdown Voltage
App 20020053710 - IO, Eiji
2002-05-09
Nonvolatile semiconductor device having a memory cells each of which is constituted of a memory transistor and a selection transistor
App 20010044183 - Io, Eiji
2001-11-22
Semiconductor device and method of fabricating the same
App 20010028065 - Io, Eiji
2001-10-11
Element isolating method in semiconductor integrated circuit device, semiconductor integrated circuit device and manufacturing method thereof
App 20010006244 - Shimizu, Masakuni ;   et al.
2001-07-05

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