Inuma; Tsuyoshi
Patent Applications and Registrations
Patent applications and USPTO patent grants for Inuma; Tsuyoshi.The latest application filed is for "measurement unit".
- Inuma; Tsuyoshi - Kanagawa JP
- Inuma; Tsuyoshi - Nagano N/A JP
- Inuma; Tsuyoshi - Kamiina-gun JP
| Patent | Date |
|---|---|
| Measurement Unit App 20220196704 - Inuma; Tsuyoshi ; et al. | 2022-06-23 |
| Probe unit Grant 11,320,461 - Hironaka , et al. May 3, 2 | 2022-05-03 |
| Conductive contactor unit Grant 11,293,946 - Hironaka , et al. April 5, 2 | 2022-04-05 |
| Probe Unit App 20220018877 - Inuma; Tsuyoshi ; et al. | 2022-01-20 |
| Probe Unit App 20220011345 - Inuma; Tsuyoshi ; et al. | 2022-01-13 |
| Probe Unit App 20200225265 - Hironaka; Kohei ; et al. | 2020-07-16 |
| Conductive Contactor Unit App 20200141975 - Hironaka; Kohei ; et al. | 2020-05-07 |
| Probe card for a semiconductor wafer Grant 8,456,184 - Yamada , et al. June 4, 2 | 2013-06-04 |
| Probe card electrically connectable with a semiconductor wafer Grant 8,149,008 - Yamada , et al. April 3, 2 | 2012-04-03 |
| Parallelism adjusting mechanism of probe card Grant 8,049,525 - Yamada , et al. November 1, 2 | 2011-11-01 |
| Probe card Grant 7,898,272 - Sasaki , et al. March 1, 2 | 2011-03-01 |
| Probe Card App 20100219852 - Yamada; Yoshio ; et al. | 2010-09-02 |
| Probe Card App 20100164518 - Yamada; Yoshio ; et al. | 2010-07-01 |
| Parallelism Adjusting Mechanism Of Probe Card App 20100001752 - Yamada; Yoshio ; et al. | 2010-01-07 |
| Probe Card App 20100001748 - Sasaki; Shunsuke ; et al. | 2010-01-07 |
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