Institutal De Cercetare Si Proiectare Tehnolocica Pentru Industria
Patent Applications and Registrations
Patent applications and USPTO patent grants for Institutal De Cercetare Si Proiectare Tehnolocica Pentru Industria.The latest application filed is for "dynamometrical deflection measuring method and apparatus".
- Institutal De Cercetare Si Proiectare Tehnolocica Pentru Industria - Cimpina RU
| Patent | Date |
|---|---|
| Dynamometrical Deflection Measuring Method And Apparatus Grant 3,832,899 - Nicolau September 3, 1 | 1974-09-03 |
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