Inoue; Yoichi
Patent Applications and Registrations
Patent applications and USPTO patent grants for Inoue; Yoichi.The latest application filed is for "method and apparatus for measuring surface temperature of cast slab".
Company Profile
0.22.18
- Inoue; Yoichi - Tokyo JP
- Inoue; Yoichi - Nagahama-shi JP
- Inoue; Yoichi - Minato-ku JP
- Inoue; Yoichi - Takasago JP
- Inoue; Yoichi - Hyogo JP
- Inoue; Yoichi - Kyoto JP
- Inoue; Yoichi - Osaka JP
- Inoue, Yoichi - Takasago-shi JP
- Inoue, Yoichi - Takasago-shi Hyogo JP
- Inoue; Yoichi - Minamisaitama-gun JP
- Inoue; Yoichi - Ryugasaki JP
Patent Activity
| Patent | Date |
|---|---|
| Method and apparatus for measuring surface temperature of cast slab Grant 9,188,493 - Honda , et al. November 17, 2 | 2015-11-17 |
| Method And Apparatus For Measuring Surface Temperature Of Cast Slab App 20150204732 - Honda; Tatsuro ; et al. | 2015-07-23 |
| Method For Molding Amorphous Alloy, And Molded Object Prouduced By Said Molding Method App 20150202684 - Hashima; Takashi ; et al. | 2015-07-23 |
| Plasma process device and plasma process method Grant 8,394,231 - Takatsuki , et al. March 12, 2 | 2013-03-12 |
| High pressure processing method and apparatus Grant 7,513,265 - Yoshikawa , et al. April 7, 2 | 2009-04-07 |
| High-pressure processing apparatus and high-pressure processing method Grant 7,435,396 - Muraoka , et al. October 14, 2 | 2008-10-14 |
| Quantitative analyzing method and quantitative analyzer using sensor Grant 7,351,323 - Iketaki , et al. April 1, 2 | 2008-04-01 |
| Plasma process device and plasma process method App 20070131171 - Takatsuki; Koichi ; et al. | 2007-06-14 |
| Sample discriminating method Grant 7,122,111 - Tokunaga , et al. October 17, 2 | 2006-10-17 |
| High pressure processing apparatus and method Grant 7,111,630 - Mizobata , et al. September 26, 2 | 2006-09-26 |
| High pressure processing apparatus and method Grant 7,080,651 - Mizobata , et al. July 25, 2 | 2006-07-25 |
| Quantitative analyzing method and quantitative analyzer using sensor App 20050258034 - Iketaki, Kazuo ; et al. | 2005-11-24 |
| Method of high pressure treatment Grant 6,962,161 - Inoue , et al. November 8, 2 | 2005-11-08 |
| High-pressure processing apparatus and high-pressure processing method App 20050079107 - Muraoka, Yusuke ; et al. | 2005-04-14 |
| High pressure processing apparatus Grant 6,874,513 - Yamagata , et al. April 5, 2 | 2005-04-05 |
| Cleaning apparatus for cleaning objects to be treated with use of cleaning composition App 20050005957 - Yamagata, Masahiro ; et al. | 2005-01-13 |
| Sample discriminating method Grant 6,824,670 - Tokunaga , et al. November 30, 2 | 2004-11-30 |
| Sample discriminating method App 20040235178 - Tokunaga, Hiroyuki ; et al. | 2004-11-25 |
| High pressure processing apparatus and method App 20040231698 - Mizobata, Ikuo ; et al. | 2004-11-25 |
| High-pressure process App 20040194884 - Sakashita, Yoshihiko ; et al. | 2004-10-07 |
| Plasma processing device and plasma processing method App 20040127033 - Takatsuki, Koichi ; et al. | 2004-07-01 |
| High pressure processing method and apparatus App 20040123484 - Yoshikawa, Tetsuya ; et al. | 2004-07-01 |
| Method of high pressure treatment App 20040103922 - Inoue, Yoichi ; et al. | 2004-06-03 |
| High-temperature and high-pressure treatment device Grant 6,733,592 - Fujikawa , et al. May 11, 2 | 2004-05-11 |
| Method and system for processing substrate Grant 6,703,316 - Inoue , et al. March 9, 2 | 2004-03-09 |
| Acrylonitrile compounds Grant 6,642,234 - Ogura , et al. November 4, 2 | 2003-11-04 |
| Method and apparatus for electrochemical measurement using statistical technique Grant 6,576,117 - Iketaki , et al. June 10, 2 | 2003-06-10 |
| High-pressure process apparatus App 20030026677 - Sakashita, Yoshihiko ; et al. | 2003-02-06 |
| High pressure processing apparatus and method App 20020170577 - Mizobata, Ikuo ; et al. | 2002-11-21 |
| Method and system for processing substrate App 20020160625 - Inoue, Yoichi ; et al. | 2002-10-31 |
| High-pressure processing apparatus App 20020148492 - Yamagata, Masahiro ; et al. | 2002-10-17 |
| Sample discriminating method App 20020139692 - Tokunaga, Hiroyuki ; et al. | 2002-10-03 |
| High-temperature and high-pressure treatment device App 20020129901 - Fujikawa, Takao ; et al. | 2002-09-19 |
| Arc ion plating device and arc ion plating system Grant 5,730,847 - Hanaguri , et al. March 24, 1 | 1998-03-24 |
| Magnetic disk device including humidity controller in disk enclosure Grant 5,075,807 - Inoue , et al. December 24, 1 | 1991-12-24 |
| Imaging processing method and apparatus suitably used for obtaining shading image Grant 5,046,108 - Inoue , et al. September 3, 1 | 1991-09-03 |
| Image processing device suitable for obtaining the volume and center of gravity of a three-dimensional binary image Grant 4,975,973 - Kasano , et al. December 4, 1 | 1990-12-04 |
| Apparatus for processing images having desired gray levels including a three-dimensional frame memory Grant 4,943,937 - Kasano , et al. July 24, 1 | 1990-07-24 |
| Image processing apparatus suitable for measuring depth of given point with respect to reference point using two stereoscopic images Grant 4,837,616 - Kasano , et al. June 6, 1 | 1989-06-06 |
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