Inoue; Hirobumi

Patent Applications and Registrations

Patent applications and USPTO patent grants for Inoue; Hirobumi.The latest application filed is for "pneumatic radial tire for heavy loads".

Company Profile

0.10.9

Inoue; Hirobumi - Kodaira JP
Inoue; Hirobumi - Kodaira-shi JP
Inoue; Hirobumi - Tokyo JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Pneumatic radial tire for heavy loads Grant 9,283,812 - Inoue March 15, 2	2016-03-15
Pneumatic Radial Tire For Heavy Loads App 20120247638 - Inoue; Hirobumi	2012-10-04
Circuit Module App 20100032198 - Inoue; Hirobumi	2010-02-11
Semiconductor device and method for manufacturing the same, circuit board, electronic apparatus, and semiconductor device manufacturing apparatus Grant 7,594,644 - Yamazaki , et al. September 29, 2	2009-09-29
Analysis method and analysis apparatus of designing transmission lines of an integrated circuit packaging board Grant 7,434,190 - Inoue , et al. October 7, 2	2008-10-07
Wiring board having connecting wiring between electrode plane and connecting pad Grant 7,321,166 - Sakai , et al. January 22, 2	2008-01-22
Analysis method and analysis apparatus App 20070033564 - Inoue; Hirobumi ; et al.	2007-02-08
Wiring board for semiconductor integrated circuit package and semiconductor integrated circuit device using the same App 20060103004 - Sakai; Jun ; et al.	2006-05-18
Semiconductor device and method for manufacturing the same, circuit board, electronic apparatus, and semiconductor device manufacturing apparatus App 20060055053 - Yamazaki; Takao ; et al.	2006-03-16
Semiconductor device and method for manufacturing the same, circuit board, electronic apparatus, and semiconductor device manufacturing apparatus Grant 6,998,704 - Yamazaki , et al. February 14, 2	2006-02-14
Semiconductor device and method for manufacturing the same, circuit board, electronic apparatus, and semiconductor device manufacturing apparatus App 20040115920 - Yamazaki, Takao ; et al.	2004-06-17
Method for fabricating probe tip portion composed by coaxial cable Grant 6,400,168 - Matsunaga , et al. June 4, 2	2002-06-04
Semiconductor device testing apparatus App 20020036514 - Taura, Toru ; et al.	2002-03-28
Method for fabricating probe tip portion composed by coaxial cable App 20010038294 - Matsunaga, Kouji ; et al.	2001-11-08
Longitudinal type high frequency probe for narrow pitched electrodes Grant 6,310,483 - Taura , et al. October 30, 2	2001-10-30
Semiconductor device tester and method of testing semiconductor device App 20010033010 - Tanioka, Michinobu ; et al.	2001-10-25
Tip portion structure of high-frequency probe and method for fabrication probe tip portion composed by coaxial cable Grant 6,281,691 - Matsunaga , et al. August 28, 2	2001-08-28
High-frequency probe capable of adjusting characteristic impedance in end part and having the end part detachable Grant 6,242,930 - Matsunaga , et al. June 5, 2	2001-06-05

uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.

While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.

All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.