Inomata; Masaichi
Patent Applications and Registrations
Patent applications and USPTO patent grants for Inomata; Masaichi.The latest application filed is for "method for marking defect and device therefor".
- Inomata; Masaichi - Yokohama JP
- Inomata; Masaichi - Kanagawa JP
| Patent | Date |
|---|---|
| Method for marking defect and device therefor Grant 7,599,052 - Uesugi , et al. October 6, 2 | 2009-10-06 |
| Method for marking defect and device therefor App 20090086209 - Uesugi; Mitsuaki ; et al. | 2009-04-02 |
| Method for marking defect and device therefor Grant 7,423,744 - Uesugi , et al. September 9, 2 | 2008-09-09 |
| Method for marking defect and device therefor Grant 7,248,366 - Uesugi , et al. July 24, 2 | 2007-07-24 |
| Method for marking defect and device therefor App 20070052964 - Uesugi; Mitsuaki ; et al. | 2007-03-08 |
| Method for marking defect and device therefor App 20020154308 - Uesugi, Mitsuaki ; et al. | 2002-10-24 |
| Apparatus for measuring three-dimensional curved surface shapes Grant 5,104,227 - Uesugi , et al. * April 14, 1 | 1992-04-14 |
| Method and apparatus for measuring a three-dimensional curved surface shape Grant 5,102,223 - Uesugi , et al. * April 7, 1 | 1992-04-07 |
| Image composing apparatus Grant 4,881,126 - Uesugi , et al. November 14, 1 | 1989-11-14 |
| Method and apparatus for measuring a three-dimensional curved surface shape Grant 4,874,955 - Uesugi , et al. October 17, 1 | 1989-10-17 |
| Fatigue crack position detection apparatus Grant 4,716,459 - Makabe , et al. December 29, 1 | 1987-12-29 |
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