Inomata; Isamu
Patent Applications and Registrations
Patent applications and USPTO patent grants for Inomata; Isamu.The latest application filed is for "prober".
- Inomata; Isamu - Nirasaki JP
- Inomata; Isamu - Nirasaki City JP
- INOMATA; Isamu - Nirasaki-shi JP
- Inomata; Isamu - Yamanashi JP
| Patent | Date |
|---|---|
| Prober for inspecting semiconductor devices formed on semiconductor wafer Grant 9,684,014 - Akiyama , et al. June 20, 2 | 2017-06-20 |
| Probe apparatus Grant 9,261,553 - Shinohara , et al. February 16, 2 | 2016-02-16 |
| Prober App 20150226767 - Akiyama; Shuji ; et al. | 2015-08-13 |
| Probe Apparatus App 20150028907 - Shinohara; Eiichi ; et al. | 2015-01-29 |
| Inspection method for inspecting electric characteristics of devices formed on target object Grant 8,536,891 - Yamamoto , et al. September 17, 2 | 2013-09-17 |
| Inspection Method For Inspecting Electric Characteristics Of Devices Formed On Target Object App 20110309849 - YAMAMOTO; Yasuhito ; et al. | 2011-12-22 |
| Inspection apparatus and method for inspecting electric characteristics of devices formed on target object Grant 8,081,007 - Yamamoto , et al. December 20, 2 | 2011-12-20 |
| Contact load measuring apparatus and inspecting apparatus Grant 7,688,096 - Inomata March 30, 2 | 2010-03-30 |
| Inspection Apparatus And Inspection Method App 20090058446 - Yamamoto; Yasuhito ; et al. | 2009-03-05 |
| Contact load measuring apparatus and inspecting apparatus App 20090039903 - Inomata; Isamu | 2009-02-12 |
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