INO; Tomomi

Patent Applications and Registrations

Patent applications and USPTO patent grants for INO; Tomomi.The latest application filed is for "additive manufacturing apparatus and additive manufacturing method".

Company Profile

0.6.7

INO; Tomomi - Yokohama JP
Ino; Tomomi - Kanagawa-ken JP
Ino; Tomomi - Yokohama-shi JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Additive Manufacturing Apparatus And Additive Manufacturing Method App 20170274599 - KITAMURA; Masaru ; et al.	2017-09-28
Manufacturing process monitoring system and manufacturing process monitoring method Grant 9,268,325 - Ino February 23, 2	2016-02-23
Manufacturing Process Monitoring System And Manufacturing Process Monitoring Method App 20120072002 - INO; Tomomi	2012-03-22
Quality control system, quality control method, and method of lot-to-lot wafer processing Grant 7,463,941 - Ogawa , et al. December 9, 2	2008-12-09
Process-state management system, management server and control server adapted for the system, method for managing process-states, method for manufacturing a product, and computer program product for the management server Grant 7,324,855 - Ushiku , et al. January 29, 2	2008-01-29
Quality control system, quality control method, and method of lot-to-lot wafer processing App 20060235560 - Ogawa; Akira ; et al.	2006-10-19
Method for determining a failure of a manufacturing condition, system for determining a failure of a manufacuring condition and method for manufacturing an industrial product App 20060085165 - Ushiku; Yukihiro ; et al.	2006-04-20
Process-state management system, management server and control server adapted for the system, method for managing process-states, method for manufacturing a product, and computer program product for the management server App 20060064188 - Ushiku; Yukihiro ; et al.	2006-03-23
Temperature measuring method and apparatus, measuring method for the thickness of the formed film, measuring apparatus for the thickness of the formed film thermometer for wafers Grant 6,780,657 - Ino , et al. August 24, 2	2004-08-24
Temperature measuring method and apparatus, measuring method for the thickness of the formed film, measuring apparatus for the thickness of the formed film thermometer for wafers Grant 6,541,287 - Ino , et al. April 1, 2	2003-04-01
Temperature measuring method and apparatus, measuring method for the thickness of the formed film, measuring apparatus for the thickness of the formed film thermometer for wafers App 20020192847 - Ino, Tomomi ; et al.	2002-12-19
Temperature Measuring Method And Apparatus, Measuring Mehtod For The Thickness Of The Formed Film, Measuring Apparatus For The Thickness Of The Formed Film Thermometer For Wafers App 20020066859 - INO, TOMOMI ; et al.	2002-06-06

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