Ino; Tadao

Patent Applications and Registrations

Patent applications and USPTO patent grants for Ino; Tadao.The latest application filed is for "method and apparatus for inspecting integrated circuit pattern".

Company Profile

0.5.5

Ino; Tadao - Hino JP
Ino; Tadao - Hino-shi JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Method and apparatus for inspecting integrated circuit pattern Grant 7,952,074 - Shinada , et al. May 31, 2	2011-05-31
Method And Apparatus For Inspecting Integrated Circuit Pattern App 20080302964 - Shinada; Hiroyuki ; et al.	2008-12-11
Method and apparatus for inspecting integrated circuit pattern Grant 7,417,444 - Shinada , et al. August 26, 2	2008-08-26
Information recording method and information recording apparatus Grant 7,263,053 - Terao , et al. August 28, 2	2007-08-28
Method and apparatus for inspecting integrated circuit pattern Grant 7,026,830 - Shinada , et al. April 11, 2	2006-04-11
Method and apparatus for inspecting integrated circuit pattern App 20060043982 - Shinada; Hiroyuki ; et al.	2006-03-02
Information recording method and information recording apparatus App 20050007936 - Terao, Motoyasu ; et al.	2005-01-13
Method and apparatus for inspecting integrated circuit pattern App 20030169060 - Shinada, Hiroyuki ; et al.	2003-09-11
Method and apparatus for inspecting integrated circuit pattern App 20020027440 - Shinada, Hiroyuki ; et al.	2002-03-07
Method and apparatus for inspecting integrated circuit pattern Grant 6,172,363 - Shinada , et al. January 9, 2	2001-01-09

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