Patent | Date |
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Testing Magnetoresistive Random Access Memory For Low Likelihood Failure App 20220101937 - Ogle; Wade ;   et al. | 2022-03-31 |
Integrated optical nanoscale probe Grant 9,978,407 - Heidmann May 22, 2 | 2018-05-22 |
Integrated Optical Nanoscale Probe App 20170316795 - Heidmann; Juergen | 2017-11-02 |
Integrated optical nanoscale probe Grant 9,779,769 - Heidmann October 3, 2 | 2017-10-03 |
Integrated optical nanoscale probe measurement of electric fields from electric charges in electronic devices Grant 9,778,329 - Heidmann October 3, 2 | 2017-10-03 |
Read sensor testing using thermal magnetic fluctuation noise spectra Grant 9,548,083 - Taratorin , et al. January 17, 2 | 2017-01-17 |
Photon emitter characterization using photoluminescence quenching in nitrogen vacancy color centers Grant 9,482,612 - Heidmann November 1, 2 | 2016-11-01 |
Magnetic write head characterization with nano-meter resolution using nitrogen vacancy color centers Grant 9,472,217 - Heidmann October 18, 2 | 2016-10-18 |
Integrated Optical Nanoscale Probe Measurement Of Electric Fields From Electric Charges In Electronic Devices App 20160282427 - Heidmann; Juergen | 2016-09-29 |
Photon Emitter Characterization Using Photoluminescence Quenching In Nitrogen Vacancy Color Centers App 20160139048 - Heidmann; Juergen | 2016-05-19 |
Integrated Optical Nanoscale Probe App 20160077167 - Heidmann; Juergen | 2016-03-17 |
Magnetic Write Head Characterization With Nano-meter Resolution Using Nitrogen Vacancy Color Centers App 20160071532 - Heidmann; Juergen | 2016-03-10 |
Spectral noise analysis for read head structures Grant 9,263,069 - Taratorin February 16, 2 | 2016-02-16 |
Write head tester using inductance Grant 9,245,550 - Taratorin January 26, 2 | 2016-01-26 |
Metrology for contactless measurement of electrical resistance change in magnetoresistive samples Grant 9,194,908 - Heidmann November 24, 2 | 2015-11-24 |
Write head tester using inductance Grant 9,135,934 - Taratorin September 15, 2 | 2015-09-15 |
Magnetic Write Head Characterization With Nano-meter Resolution Using Nitrogen Vacancy Color Centers App 20150235661 - Heidmann; Juergen | 2015-08-20 |
Magnetic write head characterization with nano-meter resolution using nitrogen vacancy color centers Grant 8,885,301 - Heidmann November 11, 2 | 2014-11-11 |
Magneto-optical Detection Of A Field Produced By A Sub-resolution Magnetic Structure App 20140133284 - Heidmann; Juergen | 2014-05-15 |
Magneto-optical detection of a field produced by a sub-resolution magnetic structure Grant 8,659,291 - Heidmann February 25, 2 | 2014-02-25 |
Spectral Noise Analysis For Read Head Structures App 20130294210 - Taratorin; Alexander M. | 2013-11-07 |
Metrology For Contactless Measurement Of Electrical Resistance Change In Magnetoresistive Samples App 20130257461 - Heidmann; Juergen | 2013-10-03 |
Testing flex and APFA assemblies for hard disk drives Grant 8,536,875 - Ogle , et al. September 17, 2 | 2013-09-17 |
Sub-optical-resolution kerr signal detection for perpendicular write-head characterization Grant 8,427,929 - Patland , et al. April 23, 2 | 2013-04-23 |
Magneto-optic write-head characterization using the recording medium as a transducer layer Grant 8,289,818 - Taratorin , et al. October 16, 2 | 2012-10-16 |
Magneto-optic Write-head Characterization Using The Recording Medium As A Transducer Layer App 20120092972 - Taratorin; Alexander M. ;   et al. | 2012-04-19 |
Write Head Tester Using Inductance App 20120056619 - Taratorin; Alexander M. | 2012-03-08 |
Sub-optical-resolution Kerr Signal Detection For Perpendicular Write-head Characterization App 20120057446 - Patland; Henry ;   et al. | 2012-03-08 |
Write Head Tester Using Inductance App 20120056618 - Taratorin; Alexander M. | 2012-03-08 |
Write head tester using inductance Grant 8,080,992 - Taratorin December 20, 2 | 2011-12-20 |
Testing Flex And Apfa Assemblies For Hard Disk Drives App 20110095766 - Ogle.; Wade A. ;   et al. | 2011-04-28 |
Magneto-Optical Detection of a Field Produced by a Sub-Resolution Magnetic Structure App 20100170017 - Heidmann; Juergen | 2010-07-01 |
Determining A Magnetic Sample Characteristic Using A Magnetic Field From A Domain Wall App 20100079908 - Heidmann; Juergen | 2010-04-01 |
Closed loop magnet control for magnetic recording head testing apparatus Grant 7,550,967 - Patland , et al. June 23, 2 | 2009-06-23 |
Read sensor testing using thermal magnetic fluctuation noise spectra App 20090147389 - Taratorin; Alexander M. ;   et al. | 2009-06-11 |
In-plane magnetic field generation and testing of magnetic sensor Grant 7,538,546 - Patland , et al. May 26, 2 | 2009-05-26 |
Write Head Tester Using Inductance App 20090128941 - Taratorin; Alexander M. | 2009-05-21 |
In-Plane Magnetic Field Generation App 20080111544 - Patland; Henry ;   et al. | 2008-05-15 |
Magnetoresistive element lifecycle tester with temperature control Grant 7,230,420 - Patland , et al. June 12, 2 | 2007-06-12 |
Magnetoresistive element lifecycle tester with temperature control App 20050258827 - Patland, Henry ;   et al. | 2005-11-24 |
Magnetoresistive element lifecycle tester Grant 6,943,546 - Patland , et al. September 13, 2 | 2005-09-13 |
Magnetic head tester Grant 6,943,545 - Patland , et al. September 13, 2 | 2005-09-13 |