Inagaki, Takefumi
Patent Applications and Registrations
Patent applications and USPTO patent grants for Inagaki, Takefumi.The latest application filed is for "method of configuring simulation program for computing amounts of heat exchanged and storage medium containing the simulation program".
- Inagaki, Takefumi - Kanagawa JP
- Inagaki, Takefumi - Kawasaki-shi JP
- Inagaki; Takefumi - Kawasaki JP
| Patent | Date |
|---|---|
| Method of configuring simulation program for computing amounts of heat exchanged and storage medium containing the simulation program App 20040199371 - Sasano, Masae ; et al. | 2004-10-07 |
| Air conditioner App 20010001923 - Katayama, Masashi ; et al. | 2001-05-31 |
| Air conditioner Grant 6,202,428 - Katayama , et al. March 20, 2 | 2001-03-20 |
| Ink jet recording method and apparatus, ink and ink cartridge Grant 6,084,610 - Ozaki , et al. July 4, 2 | 2000-07-04 |
| Holographic deflection device Grant 4,938,550 - Inagaki , et al. July 3, 1 | 1990-07-03 |
| Laser beam scanner Grant 4,848,862 - Yamazaki , et al. July 18, 1 | 1989-07-18 |
| Optical pickup Grant 4,824,191 - Kato , et al. April 25, 1 | 1989-04-25 |
| Uneven-surface data detection apparatus Grant 4,728,186 - Eguchi , et al. March 1, 1 | 1988-03-01 |
| Hologram scanner Grant 4,655,541 - Yamazaki , et al. April 7, 1 | 1987-04-07 |
| Pattern recognition apparatus and a pattern recognition method Grant 4,651,341 - Nakashima , et al. March 17, 1 | 1987-03-17 |
| Light-beam scanning apparatus Grant 4,647,143 - Yamazaki , et al. March 3, 1 | 1987-03-03 |
| Beam scanning type information readout device Grant 4,639,070 - Ikeda , et al. January 27, 1 | 1987-01-27 |
| Laser light source device Grant 4,637,027 - Shirasaki , et al. January 13, 1 | 1987-01-13 |
| Apparatus for detecting edge of semitransparent plane substance Grant 4,559,452 - Igaki , et al. December 17, 1 | 1985-12-17 |
| Recognition method and apparatus Grant 4,450,579 - Nakashima , et al. May 22, 1 | 1984-05-22 |
| Back-scattered electron detector for use in an electron microscope or electron beam exposure system to detect back-scattered electrons Grant 4,177,379 - Furukawa , et al. December 4, 1 | 1979-12-04 |
| Light scanning system Grant 4,165,464 - Ikeda , et al. August 21, 1 | 1979-08-21 |
| Method for inspecting flaws of material Grant 3,964,830 - Ikeda , et al. June 22, 1 | 1976-06-22 |
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