Inada; Yoshikazu

Patent Applications and Registrations

Patent applications and USPTO patent grants for Inada; Yoshikazu.The latest application filed is for "defective product inspection apparatus, probe positioning method and probe moving method".

Company Profile

0.6.9

Inada; Yoshikazu - Hitachinaka JP
Inada; Yoshikazu - Neyagawa-shi JP
Inada; Yoshikazu - Toride JP
Inada; Yoshikazu - Neyagawa JP
Inada, Yoshikazu - Neyagawa-shi Osaka JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Defective product inspection apparatus, probe positioning method and probe moving method Grant 8,074,293 - Hazaki , et al. December 6, 2	2011-12-06
Defective Product Inspection Apparatus, Probe Positioning Method And Probe Moving Method App 20090230984 - HAZAKI; Eiichi ; et al.	2009-09-17
Defective product inspection apparatus, probe positioning method and probe moving method Grant 7,553,334 - Hazaki , et al. June 30, 2	2009-06-30
Defective product inspection apparatus, probe positioning method and probe moving method App 20080048699 - Hazaki; Eiichi ; et al.	2008-02-28
Defective product inspection apparatus, probe positioning method and probe moving method Grant 7,297,945 - Hazaki , et al. November 20, 2	2007-11-20
Inspection method and inspection apparatus using electron beam Grant 7,271,385 - Gunji , et al. September 18, 2	2007-09-18
Insulating and thermally conductive resin composition, molded article and method of producing the composition App 20060247355 - Kosaka; Wataru ; et al.	2006-11-02
Defect inspecting apparatus Grant 7,129,727 - Saito , et al. October 31, 2	2006-10-31
Defect inspecting apparatus App 20060087330 - Saito; Tsutomu ; et al.	2006-04-27
Inspection method and inspection apparatus using electron beam App 20060076490 - Gunji; Yasuhiro ; et al.	2006-04-13
Resin composition with high thermal conductivity and method of producing the same Grant 6,995,205 - Matsukawa , et al. February 7, 2	2006-02-07
Defective product inspection apparatus, probe positioning method and probe moving method App 20050139781 - Hazaki, Eiichi ; et al.	2005-06-30
Inspection method and inspection apparatus using electron beam App 20050040331 - Gunji, Yasuhiro ; et al.	2005-02-24
Resin composition with high thermal conductivity and mehod of producing the same App 20040204526 - Matsukawa, Kiyotaka ; et al.	2004-10-14
Inspection method and inspection apparatus using electron beam App 20040026633 - Gunji, Yasuhiro ; et al.	2004-02-12

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