INABA; Katsuhiko

Patent Applications and Registrations

Patent applications and USPTO patent grants for INABA; Katsuhiko.The latest application filed is for "control apparatus, system, method, and program".

Company Profile

3.11.11

INABA; Katsuhiko - Tokyo JP
Inaba; Katsuhiko - Kanagawa JP
Inaba; Katsuhiko - Akishima JP
Inaba; Katsuhiko - Ome JP
Inaba; Katsuhiko - Yokohama JP
INABA; Katsuhiko - Ome-shi JP
Inaba; Katsuhiko - Yokohama-shi JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Control Apparatus, System, Method, And Program App 20210181126 - KOBAYASHI; Shintaro ; et al.	2021-06-17
X-ray analysis device and method for optical axis alignment thereof Grant 10,837,923 - Kobayashi , et al. November 17, 2	2020-11-17
X-ray diffractometer Grant 10,585,053 - Kobayashi , et al.	2020-03-10
X-ray Analysis Device And Method For Optical Axis Alignment Thereof App 20200003708 - KOBAYASHI; SHINTARO ; et al.	2020-01-02
Method and apparatus for measuring bowing of single-crystal substrate Grant 10,444,168 - Inaba , et al. Oc	2019-10-15
X-ray Diffractometer App 20170363550 - KOBAYASHI; Shintaro ; et al.	2017-12-21
X-ray analysis apparatus Grant 9,218,315 - Mitsunaga , et al. December 22, 2	2015-12-22
X-ray intensity correction method and X-ray diffractometer Grant 9,086,367 - Mitsunaga , et al. July 21, 2	2015-07-21
X-ray diffraction apparatus and X-ray diffraction measurement method Grant 9,074,992 - Ozawa , et al. July 7, 2	2015-07-07
Method And Apparatus For Measuring Bowing Of Single-crystal Substrate App 20140379282 - INABA; Katsuhiko ; et al.	2014-12-25
X-ray Analysis Apparatus App 20130138382 - Mitsunaga; Toru ; et al.	2013-05-30
X-ray Intensity Correction Method And X-ray Diffractometer App 20130121460 - MITSUNAGA; Toru ; et al.	2013-05-16
X-ray Diffraction Apparatus And X-ray Diffraction Measurement Method App 20120140890 - Ozawa; Tetsuya ; et al.	2012-06-07
X-ray beam conditioning device and X-ray analysis apparatus Grant 7,684,543 - Matsuo , et al. March 23, 2	2010-03-23
Method and device for judging polarity of single crystal sample Grant 7,680,246 - Inaba March 16, 2	2010-03-16
Method and Device for Judging Polarity of Single Crystal Sample App 20090225946 - Inaba; Katsuhiko	2009-09-10
X-ray beam conditioning device and X-ray analysis apparatus App 20070003013 - Matsuo; Ryuji ; et al.	2007-01-04
Method of setting measuring range of reciprocal-space mapping Grant 6,999,557 - Yamaguchi , et al. February 14, 2	2006-02-14
Method and apparatus for measuring thin film, and thin film deposition system Grant 6,970,532 - Hayashi , et al. November 29, 2	2005-11-29
Method of setting measuring range of reciprocal-space mapping App 20040240611 - Yamaguchi, Susumu ; et al.	2004-12-02
Method and apparatus for measuring thin film, and thin film deposition system App 20010043668 - Hayashi, Seiichi ; et al.	2001-11-22

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