Imamura; Motoki

Patent Applications and Registrations

Patent applications and USPTO patent grants for Imamura; Motoki.The latest application filed is for "electromagnetic wave measuring apparatus, measuring method, program, and recording medium".

Company Profile

0.14.16

Imamura; Motoki - Miyagi JP
Imamura; Motoki - Saitama JP
Imamura; Motoki - Tokyo JP
Imamura, Motoki - Chiba JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Electromagnetic wave measuring apparatus, measuring method, program, and recording medium Grant 9,176,008 - Nishina , et al. November 3, 2	2015-11-03
Carrier and adhesion amount measuring apparatus, and measuring method, program, and recording medium of the same Grant 8,969,807 - Imamura , et al. March 3, 2	2015-03-03
Electromagnetic Wave Measuring Apparatus, Measuring Method, Program, And Recording Medium App 20130240736 - NISHINA; Shigeki ; et al.	2013-09-19
Electromagnetic wave measuring apparatus, measuring method, program, and recording medium Grant 8,493,057 - Nishina , et al. July 23, 2	2013-07-23
Electromagnetic wave measuring apparatus, measuring method, program, and recording medium Grant 8,481,938 - Nishina , et al. July 9, 2	2013-07-09
Carrier And Adhesion Amount Measuring Apparatus, And Measuring Method, Program, And Recording Medium Of The Same App 20130075612 - IMAMURA; Motoki ; et al.	2013-03-28
Optical measuring apparatus Grant 8,279,438 - Yamashita , et al. October 2, 2	2012-10-02
Collection medium and collection amount measuring apparatus, and measuring method, program, and recording medium of the same Grant 8,210,035 - Imamura , et al. July 3, 2	2012-07-03
Electromagnetic wave measuring apparatus, measurement method, a program, and a recording medium Grant 8,183,528 - Kato , et al. May 22, 2	2012-05-22
Electromagnetic wave measuring apparatus Grant 8,053,733 - Nishina , et al. November 8, 2	2011-11-08
Carrier And Adhesion Amount Measuring Apparatus, And Measuring Method, Program, And Recording Medium Of The Same App 20110097649 - IMAMURA; Motoki ; et al.	2011-04-28
Collection Medium And Collection Amount Measuring Apparatus, And Measuring Method, Program, And Recording Medium Of The Same App 20110094300 - IMAMURA; Motoki ; et al.	2011-04-28
Electromagnetic Wave Measuring Apparatus App 20110075127 - NISHINA; Shigeki ; et al.	2011-03-31
Electromagnetic Wave Measuring Apparatus, Measuring Method, Program, And Recording Medium App 20110001048 - NISHINA; Shigeki ; et al.	2011-01-06
Electromagnetic Wave Measuring Apparatus, Measuring Method, Program, And Recording Medium App 20100295534 - NISHINA; Shigeki ; et al.	2010-11-25
Electromagnetic Wave Measuring Apparatus, Measurement Method, A Program, And A Recording Medium App 20100271001 - KATO; Eiji ; et al.	2010-10-28
Optical Measuring Apparatus App 20100014079 - YAMASHITA; Tomoyu ; et al.	2010-01-21
Polarization mode dispersion measuring device, method, recording medium Grant 7,006,207 - Ozeki , et al. February 28, 2	2006-02-28
Polarization mode dispersion measuring device, method, recording medium App 20050052638 - Ozeki, Takeshi ; et al.	2005-03-10
Optical characteristic measuring apparatus, the method thereof and recording medium Grant 6,678,041 - Kimura , et al. January 13, 2	2004-01-13
Apparatus and method for measuring optical characteristics and recording medium Grant 6,654,104 - Kimura , et al. November 25, 2	2003-11-25
Heat Shielding Apparatus For Vertical Continuous Annealing Furnace App 20020125621 - Ueno, Naoto ; et al.	2002-09-12
Apparatus and method for measuring optical characteristics and recording medium App 20020044273 - Kimura, Eiji ; et al.	2002-04-18
Apparatus and method for measuring optical characteristics and recording medium App 20020044274 - Kimura, Eiji ; et al.	2002-04-18
Optical characteristics measuring apparatus, the method therof, and recording medium App 20020024655 - Kimura, Eiji ; et al.	2002-02-28
Optical characteristic measuring apparatus, the method thereof and recording medium App 20020003621 - Kimura, Eiji ; et al.	2002-01-10

uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.

While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.

All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.