Ikku; Yutaka

Patent Applications and Registrations

Patent applications and USPTO patent grants for Ikku; Yutaka.The latest application filed is for "icp emission spectrophotometer".

Company Profile

0.19.21

Ikku; Yutaka - Tokyo JP
Ikku; Yutaka - Chiba N/A JP
Ikku; Yutaka - Chiba-shi JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
ICP emission spectrophotometer Grant 10,309,903 - Ikku	2019-06-04
Icp Emission Spectrophotometer App 20180275069 - Ikku; Yutaka	2018-09-27
Heat transfer system for an inductively coupled plasma device Grant 9,820,370 - Nakagawa , et al. November 14, 2	2017-11-14
Sequential Icp Optical Emission Spectrometer And Method For Correcting Measurement Wavelength App 20160290862 - IKKU; Yutaka	2016-10-06
Inductively Coupled Plasma Generating Device and Inductively Coupled Plasma Analysis Device App 20160270201 - Nakagawa; Yoshitomo ; et al.	2016-09-15
Energy dispersive X-ray analyzer and method for energy dispersive X-ray analysis Grant 9,349,572 - Ikku May 24, 2	2016-05-24
ICP Optical Emission Spectrometer App 20150268169 - Ikku; Yutaka ; et al.	2015-09-24
Energy Dispersive X-Ray Analyzer and Method for Energy Dispersive X-Ray Analysis App 20150270094 - Ikku; Yutaka	2015-09-24
X-ray fluorescence analyzer and X-ray fluorescence analysis method Grant 8,611,493 - Hasegawa , et al. December 17, 2	2013-12-17
X-ray Fluorescence Analyzer And X-ray Fluorescence Analysis Method App 20120051507 - Hasegawa; Kiyoshi ; et al.	2012-03-01
Composite charged particle beam apparatus, method of processing a sample and method of preparing a sample for a transmission electron microscope using the same Grant 7,973,280 - Takahashi , et al. July 5, 2	2011-07-05
X-ray tube and X-ray analysis apparatus Grant 7,634,054 - Matoba , et al. December 15, 2	2009-12-15
X-ray tube and X-ray analysis apparatus Grant 7,627,088 - Matoba , et al. December 1, 2	2009-12-01
Section image acquiring method using combined charge particle beam apparatus and combined charge particle beam apparatus App 20090283677 - IKKU; Yutaka	2009-11-19
Method and apparatus for specifying working position on a sample and method of working the sample Grant 7,595,488 - Tashiro , et al. September 29, 2	2009-09-29
Composite charged particle beam apparatus, method of processing a sample and method of preparing a sample for a transmission electron microscope using the same App 20090206254 - Takahashi; Haruo ; et al.	2009-08-20
Defect recognizing method, defect observing method, and charged particle beam apparatus App 20090134327 - Ikku; Yutaka ; et al.	2009-05-28
Focused ion beam apparatus and sample section forming and thin-piece sample preparing methods Grant 7,531,796 - Tashiro , et al. May 12, 2	2009-05-12
Method and apparatus of measuring thin film sample and method and apparatus of fabricating thin film sample Grant 7,518,109 - Ikku , et al. April 14, 2	2009-04-14
X-ray Tube And X-ray Analysis Apparatus App 20090041196 - Matoba; Yoshiki ; et al.	2009-02-12
X-ray Tube And X-ray Analysis Apparatus App 20090028297 - Matoba; Yoshiki ; et al.	2009-01-29
Charged particle beam apparatus Grant 7,442,942 - Takahashi , et al. October 28, 2	2008-10-28
Fluorescent X-ray analysis apparatus Grant 7,436,926 - Matoba , et al. October 14, 2	2008-10-14
Sample height regulating method, sample observing method, sample processing method and charged particle beam apparatus Grant 7,423,266 - Tashiro , et al. September 9, 2	2008-09-09
Method and apparatus of measuring thin film sample and method and apparatus of fabricating thin film sample App 20080067384 - Ikku; Yutaka ; et al.	2008-03-20
Focused Ion Beam Apparatus And Sample Section Forming And Thin-piece Sample Preparing Methods App 20080042059 - Tashiro; Junichi ; et al.	2008-02-21
Fluorescent X-ray analysis apparatus App 20070269004 - Matoba; Yoshiki ; et al.	2007-11-22
Charged particle beam apparatus App 20070045560 - Takahashi; Haruo ; et al.	2007-03-01
Sample height regulating method, sample observing method, sample processing method and charged particle beam apparatus App 20060192118 - Tashiro; Junichi ; et al.	2006-08-31
Method for specifying observing or working position and apparatus thereof, and method for working sample and apparatus thereof App 20060138341 - Tashiro; Junichi ; et al.	2006-06-29
Pattern measuring method and measuring system using display microscope image Grant 7,054,506 - Ikku May 30, 2	2006-05-30
Thin specimen producing method and apparatus Grant 7,002,150 - Iwasaki , et al. February 21, 2	2006-02-21
Scanning microscope with brightness control Grant 6,924,481 - Ikku , et al. August 2, 2	2005-08-02
Focused ion beam apparatus Grant 6,888,149 - Ikku May 3, 2	2005-05-03
Thin specimen producing method and apparatus App 20040245464 - Iwasaki, Kouji ; et al.	2004-12-09
Focused ion beam apparatus App 20040011964 - Ikku, Yutaka	2004-01-22
Scanning electron microscope with appropriate brightness control function App 20020185597 - Ikku, Yutaka ; et al.	2002-12-12
Pattern measuring method and measuring system using display microscope image App 20020181776 - Ikku, Yutaka	2002-12-05
Focused charged beam apparatus, and its processing and observation method Grant 5,525,806 - Iwasaki , et al. June 11, 1	1996-06-11

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