Ikeuchi; Naoki

Patent Applications and Registrations

Patent applications and USPTO patent grants for Ikeuchi; Naoki.The latest application filed is for "method for diagnosing abnormal plasma discharge, abnormal plasma discharge diagnostics system, and computer program".

Company Profile

0.13.18

Ikeuchi; Naoki - Amagasaki JP
Ikeuchi; Naoki - Hyogo JP
Ikeuchi; Naoki - Amagasaki city JP
Ikeuchi; Naoki - Tokyo JP
Ikeuchi; Naoki - Amagasaki-shi JP
Ikeuchi; Naoki - Osaka JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Displacement measurement apparatus for microstructure and displcement measurement method thereof Grant 8,141,426 - Ikeuchi , et al. March 27, 2	2012-03-27
Method and system for diagnosing abnormal plasma discharge Grant 8,082,124 - Miyano , et al. December 20, 2	2011-12-20
Method For Diagnosing Abnormal Plasma Discharge, Abnormal Plasma Discharge Diagnostics System, And Computer Program App 20100161278 - Miyano; Takaya ; et al.	2010-06-24
Device, method and program for inspecting microstructure Grant 7,726,190 - Matsumoto , et al. June 1, 2	2010-06-01
Displacement Measurement apparatus for microstructure and displcement measurement method thereof App 20090145230 - Ikeuchi; Naoki ; et al.	2009-06-11
Vibration-Wave Detector App 20090140612 - Ikeuchi; Naoki	2009-06-04
Microstructure Probe Card, and Microstructure Inspecting Device, Method, and Computer Program App 20090128171 - Okumura; Katsuya ; et al.	2009-05-21
Microstructure Inspecting Apparatus And Microstructure Inspecting Method App 20090039908 - Ikeuchi; Naoki ; et al.	2009-02-12
Microstructure Inspecting Apparatus and Microstructure Inspecting Method App 20080302185 - Yakabe; Masami ; et al.	2008-12-11
Acceleration sensor and inclination-detecting method Grant 7,428,841 - Harada , et al. September 30, 2	2008-09-30
Minute structure inspection device, inspection method, and inspection program App 20080223136 - Yakabe; Masami ; et al.	2008-09-18
Device, Method and Program for Inspecting Microstructure App 20080190206 - Matsumoto; Toshiyuki ; et al.	2008-08-14
Device for inspecting micro structure, method for inspecting micro structure and program for inspecting micro structure Grant 7,383,732 - Okumura , et al. June 10, 2	2008-06-10
Probing card and inspection apparatus for microstructure Grant 7,348,788 - Yakabe , et al. March 25, 2	2008-03-25
Semiconductor device having microstructure and method of manufacturing microstructure App 20070262306 - Ikeuchi; Naoki ; et al.	2007-11-15
Probe App 20070257692 - Yakabe; Masami ; et al.	2007-11-08
Probing card and inspection apparatus for microstructure App 20070069746 - Yakabe; Masami ; et al.	2007-03-29
Acceleration sensor and inclination-detecting method App 20060162450 - Harada; Muneo ; et al.	2006-07-27
Electrostatic capacitance detection circuit and microphone device Grant 7,034,551 - Yakabe , et al. April 25, 2	2006-04-25
Impedance measuring circuit and capacitance measuring circuit Grant 7,023,223 - Yakabe , et al. April 4, 2	2006-04-04
Electrostatic capacitance detection circuit and microphone device Grant 7,019,540 - Yakabe , et al. March 28, 2	2006-03-28
Circuit and method for impedance detection Grant 7,005,865 - Yakabe , et al. February 28, 2	2006-02-28
Device for inspecting micro structure, method for inspecting micro structure and program for inspecting micro structure App 20050279170 - Okumura, Katsuya ; et al.	2005-12-22
Microstructure with movable mass Grant 6,931,928 - Hashimoto , et al. August 23, 2	2005-08-23
Capacitance measuring circuit, capacitance measuring instrument, and microphone device App 20050040833 - Yakabe, Masami ; et al.	2005-02-24
Impedance measuring circuit, it's method, and capacitance measuring circuit App 20050035771 - Yakabe, Masami ; et al.	2005-02-17
Impedance measuring circuit and capacitance measuring circuit App 20050030046 - Yakabe, Masami ; et al.	2005-02-10
Microstructure with movable mass App 20050016271 - Hashimoto, Hiroyuki ; et al.	2005-01-27
Capacitance measuring circuit capacitance measuring instrument and microphone device App 20050017737 - Yakabe, Masami ; et al.	2005-01-27
Vibration wave detector Grant 6,438,243 - Ikeuchi , et al. August 20, 2	2002-08-20
Vibration wave detecting method and vibration wave detector Grant 6,223,601 - Harada , et al. May 1, 2	2001-05-01

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