Ikegami; Eiji
Patent Applications and Registrations
Patent applications and USPTO patent grants for Ikegami; Eiji.The latest application filed is for "plasma processing method and apparatus".
- Ikegami; Eiji - Kudamatsu JP
- IKEGAMI; Eiji - Kudamatsu-shi JP
- Ikegami; Eiji - Kyoto JP
- Ikegami, Eiji - Kyoto-shi JP
| Patent | Date |
|---|---|
| Plasma processing method and apparatus Grant 9,230,782 - Ikegami , et al. January 5, 2 | 2016-01-05 |
| Plasma Processing Method And Apparatus App 20150020970 - IKEGAMI; Eiji ; et al. | 2015-01-22 |
| Plasma processing method and apparatus Grant 8,900,401 - Ikegami , et al. December 2, 2 | 2014-12-02 |
| Plasma processing method and apparatus Grant 8,038,896 - Ikegami , et al. October 18, 2 | 2011-10-18 |
| Plasma Processing Method And Apparatus App 20100288195 - IKEGAMI; Eiji ; et al. | 2010-11-18 |
| Test strip measuring method Grant 7,833,792 - Mori , et al. November 16, 2 | 2010-11-16 |
| Plasma Etching Method App 20080076259 - OOTA; Yoshiyuki ; et al. | 2008-03-27 |
| Plasma processing method and apparatus App 20070281478 - Ikegami; Eiji ; et al. | 2007-12-06 |
| Method and apparatus for plasma processing App 20060196605 - Ikegami; Eiji ; et al. | 2006-09-07 |
| Test strip measuring method and device App 20050191210 - Mori, Masaaki ; et al. | 2005-09-01 |
| LSI device etching method and apparatus thereof Grant 6,919,274 - Kazumi , et al. July 19, 2 | 2005-07-19 |
| LSI device etching method and apparatus thereof App 20050026431 - Kazumi, Hideyuki ; et al. | 2005-02-03 |
| Test strip measuring method and device App 20030049849 - Mori, Masaaki ; et al. | 2003-03-13 |
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