Ikeda; Mitsuji
Patent Applications and Registrations
Patent applications and USPTO patent grants for Ikeda; Mitsuji.The latest application filed is for "pattern matching device and computer program for pattern matching".
Company Profile
3.44.48
- Ikeda; Mitsuji - Hitachinaka JP
- IKEDA; Mitsuji - Tokyo JP
- - Hitachinaka JP
- Ikeda, Mitsuji - Hitachinaka-shi JP
- Ikeda; Mitsuji - Katsuta JP
- Ikeda; Mitsuji - Nagoya JP
Patent Activity
| Patent | Date |
|---|---|
| Pattern matching apparatus and computer program Grant 10,535,129 - Kitazawa , et al. Ja | 2020-01-14 |
| Pattern Matching Device and Computer Program for Pattern Matching App 20180005363 - NAGATOMO; Wataru ; et al. | 2018-01-04 |
| Image processing apparatus, distortion-corrected map creation apparatus, and semiconductor measurement apparatus Grant 9,514,528 - Taguchi , et al. December 6, 2 | 2016-12-06 |
| Device and method for detecting angle of rotation from normal position of image Grant 9,514,526 - Taguchi , et al. December 6, 2 | 2016-12-06 |
| Inspection apparatus Grant 9,183,450 - Abe , et al. November 10, 2 | 2015-11-10 |
| Pattern matching method, image processing device, and computer program Grant 9,141,879 - Ushiba , et al. September 22, 2 | 2015-09-22 |
| Template matching processing device and template matching processing program Grant 8,971,627 - Taguchi , et al. March 3, 2 | 2015-03-03 |
| Pattern matching method and image processing device Grant 8,953,894 - Sato , et al. February 10, 2 | 2015-02-10 |
| Image Processing Apparatus, Distortion-corrected Map Creation Apparatus, And Semiconductor Measurement Apparatus App 20140341461 - Taguchi; Junichi ; et al. | 2014-11-20 |
| Pattern matching method and pattern matching apparatus Grant 8,885,950 - Nagatomo , et al. November 11, 2 | 2014-11-11 |
| Pattern measuring apparatus Grant 8,872,106 - Nishihama , et al. October 28, 2 | 2014-10-28 |
| Pattern Measuring Apparatus App 20140021349 - Nishihama; Hiroshi ; et al. | 2014-01-23 |
| Pattern Measuring Apparatus App 20140021350 - NISHIHAMA; Hiroshi ; et al. | 2014-01-23 |
| Pattern Matching Apparatus And Computer Program App 20140023265 - Kitazawa; Masahiro ; et al. | 2014-01-23 |
| Device And Method For Detecting Angle Of Rotation From Normal Position Of Image App 20140016824 - Taguchi; Jun'ichi ; et al. | 2014-01-16 |
| Pattern measuring apparatus Grant 08618517 - | 2013-12-31 |
| Pattern Matching Method, Image Processing Device, And Computer Program App 20130216141 - Ushiba; Hiroyuki ; et al. | 2013-08-22 |
| Image inspection apparatus Grant 8,498,489 - Abe , et al. July 30, 2 | 2013-07-30 |
| Method For Creating Template For Patternmatching, And Image Processing Apparatus App 20130170757 - Shinoda; Shinichi ; et al. | 2013-07-04 |
| Template Matching Processing Device And Template Matching Processing Program App 20130114898 - Taguchi; Jun'ichi ; et al. | 2013-05-09 |
| Charged particle beam apparatus Grant 8,335,397 - Takane , et al. December 18, 2 | 2012-12-18 |
| Image processing system and scanning electron microscope Grant 8,305,435 - Sato , et al. November 6, 2 | 2012-11-06 |
| Method and apparatus for computing degree of matching Grant 8,285,056 - Taguchi , et al. October 9, 2 | 2012-10-09 |
| Charged particle beam apparatus Grant 8,263,935 - Takane , et al. September 11, 2 | 2012-09-11 |
| Pattern Matching Method and Pattern Matching Apparatus App 20120207397 - Nagatomo; Wataru ; et al. | 2012-08-16 |
| Pattern Matching Method, Pattern Matching Program, Electronic Computer, and Electronic Device Testing Apparatus App 20120182415 - Toyoda; Yasutaka ; et al. | 2012-07-19 |
| Image processing apparatus for analysis of pattern matching failure Grant 8,200,006 - Ikeda , et al. June 12, 2 | 2012-06-12 |
| Image processing method for determining matching position between template and search image Grant 8,139,868 - Abe , et al. March 20, 2 | 2012-03-20 |
| Pattern Matching Method And Image Processing Device App 20110262043 - Sato; Yoshimichi ; et al. | 2011-10-27 |
| Pattern matching apparatus and scanning electron microscope using the same Grant 8,041,104 - Toyoda , et al. October 18, 2 | 2011-10-18 |
| Apparatus, method and program product for matching with a template Grant 8,019,164 - Taguchi , et al. September 13, 2 | 2011-09-13 |
| Defect Review Device, Defect Review Method, And Defect Review Execution Program App 20110129140 - Kitazawa; Masahiro ; et al. | 2011-06-02 |
| Image Inspection Apparatus App 20110110597 - Abe; Yuichi ; et al. | 2011-05-12 |
| Inspection apparatus using template matching method using similarity distribution Grant 7,925,076 - Abe , et al. April 12, 2 | 2011-04-12 |
| Charged Particle Beam Apparatus App 20100102224 - TAKANE; Atsushi ; et al. | 2010-04-29 |
| Charged particle beam apparatus Grant 7,652,249 - Takane , et al. January 26, 2 | 2010-01-26 |
| Charged particle beam apparatus Grant 7,642,514 - Takane , et al. January 5, 2 | 2010-01-05 |
| Image Processing System and Scanning Electron Microscope App 20090295914 - SATO; Yoshimichi ; et al. | 2009-12-03 |
| Method And Apparatus For Computing Degree Of Matching App 20090232405 - Taguchi; Junichi ; et al. | 2009-09-17 |
| Image processing apparatus for analysis of pattern matching failure App 20090214122 - IKEDA; Mitsuji ; et al. | 2009-08-27 |
| Image processing apparatus for analysis of pattern matching failure Grant 7,545,977 - Ikeda , et al. June 9, 2 | 2009-06-09 |
| Inspection Apparatus and Method App 20090087103 - Abe; Yuichi ; et al. | 2009-04-02 |
| Data Management Equipment Used To Defect Review Equipment And Testing System Configurations App 20090074286 - KITAZAWA; Masahiro ; et al. | 2009-03-19 |
| Charged Particle Beam Apparatus App 20080292199 - Takane; Atsushi ; et al. | 2008-11-27 |
| Apparatus, method and program product for matching with a template App 20080205769 - Taguchi; Junichi ; et al. | 2008-08-28 |
| Charged particle beam apparatus App 20080116376 - Takane; Atsushi ; et al. | 2008-05-22 |
| Charged particle beam apparatus App 20080073526 - Takane; Atsushi ; et al. | 2008-03-27 |
| Inspection Apparatus Using Template Matching Method Using Similarity Distribution App 20080069453 - Abe; Yuichi ; et al. | 2008-03-20 |
| Charged particle beam apparatus Grant 7,329,868 - Takane , et al. February 12, 2 | 2008-02-12 |
| Inspection apparatus App 20070258640 - Abe; Yuichi ; et al. | 2007-11-08 |
| Semiconductor inspection system App 20070194236 - Takane; Atsushi ; et al. | 2007-08-23 |
| Semiconductor inspection system Grant 7,235,782 - Takane , et al. June 26, 2 | 2007-06-26 |
| Method and apparatus for measuring three-dimensional shape of specimen by using SEM Grant 7,230,243 - Tanaka , et al. June 12, 2 | 2007-06-12 |
| Image processing apparatus for analysis of pattern matching failure App 20070045538 - Ikeda; Mitsuji ; et al. | 2007-03-01 |
| Charged particle beam apparatus App 20070023657 - Takane; Atsushi ; et al. | 2007-02-01 |
| Charged particle beam apparatus Grant 7,109,485 - Takane , et al. September 19, 2 | 2006-09-19 |
| Statistic calculating method using a template and corresponding sub-image to determine similarity based on sum of squares thresholding Grant 7,082,224 - Ikeda , et al. July 25, 2 | 2006-07-25 |
| Shape measuring device and shape measuring method Grant 7,078,688 - Kazui , et al. July 18, 2 | 2006-07-18 |
| Semiconductor inspection system Grant 7,026,615 - Takane , et al. April 11, 2 | 2006-04-11 |
| Pattern matching apparatus and scanning electron microscope using the same App 20060045326 - Toyoda; Yasutaka ; et al. | 2006-03-02 |
| Method and apparatus for measuring three-dimensional shape of specimen by using SEM App 20050285034 - Tanaka, Maki ; et al. | 2005-12-29 |
| Foreign matter detecting system App 20050219523 - Onuma, Chieko ; et al. | 2005-10-06 |
| Charged particle beam apparatus Grant 6,936,818 - Takane , et al. August 30, 2 | 2005-08-30 |
| Charged particle beam apparatus App 20050184237 - Takane, Atsushi ; et al. | 2005-08-25 |
| Statistic calculating method using a template and corresponding sub-image to determine similarity based on sum of squares thresholding App 20050147305 - Ikeda, Mitsuji ; et al. | 2005-07-07 |
| Shape measuring device and shape measuring method App 20050061973 - Kazui, Masato ; et al. | 2005-03-24 |
| Display device Grant 6,850,219 - Aoyama , et al. February 1, 2 | 2005-02-01 |
| Shape measurement method and apparatus App 20040164243 - Kazui, Masato ; et al. | 2004-08-26 |
| Shape measurement method and apparatus Grant 6,756,590 - Kazui , et al. June 29, 2 | 2004-06-29 |
| Charged particle beam apparatus App 20040069956 - Takane, Atsushi ; et al. | 2004-04-15 |
| Charged particle beam apparatus Grant 6,653,633 - Takane , et al. November 25, 2 | 2003-11-25 |
| Shape measurement method and apparatus App 20030197873 - Kazui, Masato ; et al. | 2003-10-23 |
| Semiconductor inspection system App 20030173516 - Takane, Atsushi ; et al. | 2003-09-18 |
| Charged particle beam apparatus App 20030136907 - Takane, Atsushi ; et al. | 2003-07-24 |
| Image-formation apparatus using charged particle beams under various focus conditions Grant 6,538,249 - Takane , et al. March 25, 2 | 2003-03-25 |
| Semiconductor inspection system App 20020158199 - Takane, Atsushi ; et al. | 2002-10-31 |
| Electronics device applying an image sensor App 20020080239 - Ikeda, Mitsuji ; et al. | 2002-06-27 |
| Display device App 20020011980 - Aoyama, Tetsuya ; et al. | 2002-01-31 |
| Method of processing a program by parallel processing, and a processing unit thereof Grant 5,410,696 - Seki , et al. April 25, 1 | 1995-04-25 |
| Optical fiber built-in type composite insulator and method for producing the same Grant 5,136,680 - Seike , et al. August 4, 1 | 1992-08-04 |
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