IIZUMI; Takashi

Patent Applications and Registrations

Patent applications and USPTO patent grants for IIZUMI; Takashi.The latest application filed is for "photo-alignment polymer, binder composition, binder layer, optical laminate, optical laminate manufacturing method, and image display device".

Company Profile

5.33.38

IIZUMI; Takashi - Kanagawa JP
Iizumi; Takashi - Minami-ashigara JP
IIZUMI; Takashi - Minami-ashigara-shi JP
IIZUMI; Takashi - Minamiashigara-shi JP
IIZUMI; Takashi - Ashigarakami-gun JP
IIZUMI; Takashi - Fujinomiya-shi JP
Iizumi; Takashi - Hitachinaka N/A JP
Iizumi; Takashi - Hiatchinaka-shi JP
Iizumi; Takashi - Hitachinaka-shi JP
Iizumi; Takashi - Kawasaki JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Photo-alignment Polymer, Binder Composition, Binder Layer, Optical Laminate, Optical Laminate Manufacturing Method, And Image Display Device App 20220179250 - IIZUMI; Takashi ; et al.	2022-06-09
Photo-alignable polymer, binder composition, binder layer, optical laminate, method for producing optical laminate, and image display device Grant 11,319,393 - Tamura , et al. May 3, 2	2022-05-03
Photo-alignment Copolymer, Binder Composition, Binder Layer, Optical Laminate, And Image Display Device App 20210292456 - NOZOE; Yutaka ; et al.	2021-09-23
Photo-alignment Copolymer, Photo-alignment Film, And Optical Laminate App 20210063825 - NOZOE; Yutaka ; et al.	2021-03-04
Compound, coloring composition for dyeing or textile printing, ink for ink jet textile printing, method of printing on fabric, and dyed or printed fabric Grant 10,662,332 - Iizumi , et al.	2020-05-26
Photo-alignable Polymer, Binder Composition, Binder Layer, Optical Laminate, Method For Producing Optical Laminate, And Image Di App 20200079885 - TAMURA; Akio ; et al.	2020-03-12
Photo-alignment Copolymer, Photo-alignment Film, And Optical Laminate App 20200004087 - NOZOE; Yutaka ; et al.	2020-01-02
Coloring composition for textile printing, textile printing method, ink for ink jet textile printing, and dyed fabric Grant 10,487,210 - Yagi , et al. Nov	2019-11-26
Novel Compound, Coloring Composition For Dyeing Or Textile Printing, Ink For Ink Jet Textile Printing, Method Of Printing On Fabric, And Dyed Or Printed Fabric App 20180208773 - IIZUMI; Takashi ; et al.	2018-07-26
Novel Compound, Coloring Composition For Dyeing Or Textile Printing, Ink For Ink Jet Textile Printing, Method Of Printing On Fabric, And Dyed Or Printed Fabric App 20180208772 - IIZUMI; Takashi ; et al.	2018-07-26
Coloring Composition For Textile Printing, Textile Printing Method, Ink For Ink Jet Textile Printing, And Dyed Fabric App 20170247544 - YAGI; Kazunari ; et al.	2017-08-31
Novel Compound, Coloring Composition For Dyeing Or Textile Printing, Ink Jet Ink, Method Of Printing On Fabric, And Dyed Or Printed Fabric App 20170101533 - YAGI; Kazunari ; et al.	2017-04-13
Azo Compound, Aqueous Solution, Ink Composition, Ink For Inkjet Recording, Inkjet Recording Method, Ink Cartridge For Inkjet Recording, And Inkjet Recorded Material App 20140084578 - YAGI; Kazunari ; et al.	2014-03-27
Scanning electron microscope Grant 8,666,165 - Yamaguchi , et al. March 4, 2	2014-03-04
Sample dimension measuring method and scanning electron microscope Grant 7,910,886 - Kawada , et al. March 22, 2	2011-03-22
System and method for on-line diagnostics Grant 7,849,304 - Arima , et al. December 7, 2	2010-12-07
Image evaluation method and microscope Grant 7,805,023 - Ishitani , et al. September 28, 2	2010-09-28
Method of forming a sample image and charged particle beam apparatus Grant 7,800,059 - Sato , et al. September 21, 2	2010-09-21
Industrial device receiving remote maintenance operation and outputting charge information Grant 7,551,976 - Arima , et al. June 23, 2	2009-06-23
Scanning Electron Microscope App 20090041333 - YAMAGUCHI; Satoru ; et al.	2009-02-12
Scanning electron microscope Grant 7,439,505 - Yamaguchi , et al. October 21, 2	2008-10-21
Method for measuring line and space pattern using scanning electron microscope Grant 7,433,542 - Takane , et al. October 7, 2	2008-10-07
Method of forming a sample image and charged particle beam apparatus App 20080217535 - Sato; Mitsugu ; et al.	2008-09-11
Sample dimension measuring method and scanning electron microscope App 20080179517 - Kawada; Hiroki ; et al.	2008-07-31
System And Method For On-line Diagnostics App 20080133032 - Arima; Juntaro ; et al.	2008-06-05
System and method for on-line diagnostics Grant 7,373,501 - Arima , et al. May 13, 2	2008-05-13
Charged particle system and a method for measuring image magnification Grant 7,372,047 - Sato , et al. May 13, 2	2008-05-13
Method and apparatus for circuit pattern inspection Grant 7,369,703 - Yamaguchi , et al. May 6, 2	2008-05-06
Method of forming a sample image and charged particle beam apparatus Grant 7,361,894 - Sato , et al. April 22, 2	2008-04-22
Image evaluation method and microscope Grant 7,340,111 - Ishitani , et al. March 4, 2	2008-03-04
System and method for on-line diagnostics App 20080005554 - Arima; Juntaro ; et al.	2008-01-03
Image evaluation method and microscope App 20070280559 - Ishitani; Tohru ; et al.	2007-12-06
Sample dimension measuring method and scanning electron microscope Grant 7,285,777 - Kawada , et al. October 23, 2	2007-10-23
Image evaluation method and microscope Grant 7,236,651 - Ishitani , et al. June 26, 2	2007-06-26
Remote maintenance method, industrial device, and semiconductor device App 20070112452 - Arima; Juntaro ; et al.	2007-05-17
Remote maintenance method for generating maintenance charge information, industrial device, and semiconductor device Grant 7,177,715 - Arima , et al. February 13, 2	2007-02-13
Method of forming a sample image and charged particle beam apparatus App 20070029478 - Sato; Mitsugu ; et al.	2007-02-08
Method of forming a sample image and charged particle beam apparatus Grant 7,164,126 - Sato , et al. January 16, 2	2007-01-16
Method and apparatus for circuit pattern inspection App 20060269121 - Yamaguchi; Atsuko ; et al.	2006-11-30
Method and apparatus for circuit pattern inspection Grant 7,095,884 - Yamaguchi , et al. August 22, 2	2006-08-22
Remote maintenance method, industrial device, and semiconductor device Grant 7,047,096 - Arima , et al. May 16, 2	2006-05-16
Scanning electron microscope App 20060097158 - Yamaguchi; Satoru ; et al.	2006-05-11
Method of forming a sample image and charged particle beam apparatus Grant 7,034,296 - Sato , et al. April 25, 2	2006-04-25
Scanning electron microscope Grant 7,002,151 - Yamaguchi , et al. February 21, 2	2006-02-21
Sample dimension measuring method and scanning electron microscope App 20050247876 - Kawada, Hiroki ; et al.	2005-11-10
Remote maintenance method for industrial device that generates maintenance charge information using received charge list Grant 6,954,677 - Arima , et al. October 11, 2	2005-10-11
Method for measuring line and space pattern using scanning electron microscope App 20050207673 - Takane, Atsushi ; et al.	2005-09-22
Image evaluation method and microscope App 20050199811 - Ishitani, Tohru ; et al.	2005-09-15
Charged particle system and a method for measuring image magnification App 20050189501 - Sato, Mitsugu ; et al.	2005-09-01
Method and system for monitoring a semiconductor device manufacturing process Grant 6,909,930 - Shishido , et al. June 21, 2	2005-06-21
Scanning electron microscope App 20050109937 - Yamaguchi, Satoru ; et al.	2005-05-26
Remote maintenance method, industrial device, and semiconductor device Grant 6,862,485 - Arima , et al. March 1, 2	2005-03-01
Remote maintenance method, industrial device, and semiconductor device App 20050038546 - Arima, Juntaro ; et al.	2005-02-17
Remote maintenance method, industrial device, and semiconductor device App 20050038545 - Arima, Juntaro ; et al.	2005-02-17
Remote maintenance method, industrial device, and semiconductor device App 20050033465 - Arima, Juntaro ; et al.	2005-02-10
Scanning electron microscope Grant 6,803,573 - Yamaguchi , et al. October 12, 2	2004-10-12
Remote maintenance method, industrial device, and semiconductor device Grant 6,792,325 - Arima , et al. September 14, 2	2004-09-14
Remote maintenance method, industrial device, and semiconductor device Grant 6,708,072 - Arima , et al. March 16, 2	2004-03-16
System and method for on-line diagnostics App 20030226010 - Arima, Juntaro ; et al.	2003-12-04
Scanning electron microscope Grant 6,627,888 - Yamaguchi , et al. September 30, 2	2003-09-30
Method of forming a sample image and charged particle beam apparatus App 20030141451 - Sato, Mitsugu ; et al.	2003-07-31
Method of forming a sample image and charged particle beam apparatus App 20030111602 - Sato, Mitsugu ; et al.	2003-06-19
Image evaluation method and microscope App 20030039386 - Ishitani, Tohru ; et al.	2003-02-27
Method and apparatus for circuit pattern inspection App 20030021463 - Yamaguchi, Atsuko ; et al.	2003-01-30
Method and system for monitoring a semiconductor device manufacturing process App 20030015660 - Shishido, Chie ; et al.	2003-01-23
Remote maintenance method, industrial device, and semiconductor device App 20020183876 - Arima, Juntaro ; et al.	2002-12-05
Remote maintenance method, industrial device, and semiconductor device App 20020183880 - Arima, Juntaro ; et al.	2002-12-05
Remote maintenance method, industrial device, and semiconductor device App 20020183875 - Arima, Juntaro ; et al.	2002-12-05
Scanning electron microscope App 20010019109 - Yamaguchi, Satoru ; et al.	2001-09-06
Image correction system for scanning electron microscope Grant 4,907,287 - Homma , et al. March 6, 1	1990-03-06

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