Iizumi; Ken
Patent Applications and Registrations
Patent applications and USPTO patent grants for Iizumi; Ken.The latest application filed is for "data processing device, semiconductor external view inspection device, and data volume increase alleviation method".
- Iizumi; Ken - Tokyo JP
- Iizumi; Ken - Hitachinaka JP
| Patent | Date |
|---|---|
| Data processing device, semiconductor external view inspection device, and data volume increase alleviation method Grant 9,489,324 - Sakurai , et al. November 8, 2 | 2016-11-08 |
| Data Processing Device, Semiconductor External View Inspection Device, And Data Volume Increase Alleviation Method App 20140372656 - Sakurai; Yuichi ; et al. | 2014-12-18 |
| Semiconductor Inspecting Apparatus App 20130136334 - Sakurai; Yuichi ; et al. | 2013-05-30 |
| Measurement method of electron beam current, electron beam lithography method and system App 20060011869 - Tanaka; Noriyuki ; et al. | 2006-01-19 |
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