IIZUKA; Yoshikazu

Patent Applications and Registrations

Patent applications and USPTO patent grants for IIZUKA; Yoshikazu.The latest application filed is for "failure analysis system of semiconductor device, failure analysis method of semiconductor device, and non-transitory computer readable medium".

Company Profile

0.6.7

IIZUKA; Yoshikazu - Kawasaki JP
Iizuka; Yoshikazu - Kanagawa JP
IIZUKA; Yoshikazu - Kawasaki-Shi JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Failure Analysis System Of Semiconductor Device, Failure Analysis Method Of Semiconductor Device, And Non-transitory Computer Readable Medium App 20220066854 - KODAMA; Mami ; et al.	2022-03-03
Semiconductor device failure analysis system and semiconductor memory device Grant 9,128,143 - Kodama , et al. September 8, 2	2015-09-08
Semiconductor Device Failure Analysis System And Semiconductor Memory Device App 20140043360 - KODAMA; Mami ; et al.	2014-02-13
Failure analyzing device and failure analyzing method Grant 8,479,063 - Iizuka July 2, 2	2013-07-02
Failure analysis method, failure analysis apparatus, and computer program product Grant 8,316,264 - Iizuka November 20, 2	2012-11-20
Failure Analyzing Device And Failure Analyzing Method App 20120036405 - IIZUKA; Yoshikazu	2012-02-09
Fail Analysis System And Method For Semiconductor Device App 20120011421 - KODAMA; Mami ; et al.	2012-01-12
Failure Analysis Method, Failure Analysis Apparatus, And Computer Program Product App 20110154138 - IIZUKA; Yoshikazu	2011-06-23
Semiconductor apparatus and testing method Grant 7,716,549 - Iizuka May 11, 2	2010-05-11
Semiconductor apparatus and testing method App 20080059851 - Iizuka; Yoshikazu	2008-03-06
Fault position identification system for a semiconductor device and method of identifying a fault position of a semiconductor device Grant 7,238,958 - Iizuka July 3, 2	2007-07-03
Fault position identification system for a semiconductor device and method of identifying a fault position of a semiconductor device App 20050229063 - Iizuka, Yoshikazu	2005-10-13

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