Iijima; Hirofumi

Patent Applications and Registrations

Patent applications and USPTO patent grants for Iijima; Hirofumi.The latest application filed is for "transmission electron microscope and method of controlling same".

Company Profile

4.8.8

Iijima; Hirofumi - Tokyo JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Charged particle beam device and control method of optical system of charged particle beam device Grant 11,222,764 - Yamazaki , et al. January 11, 2	2022-01-11
Transmission electron microscope and method of controlling same Grant 11,133,151 - Iijima September 28, 2	2021-09-28
Transmission Electron Microscope and Method of Controlling Same App 20210151286 - Iijima; Hirofumi	2021-05-20
Charged Particle Beam Device and Control Method of Optical System of Charged Particle Beam Device App 20200343072 - Yamazaki; Kazuya ; et al.	2020-10-29
Electron microscope Grant 10,741,358 - Shimizu , et al. A	2020-08-11
Electron Microscope App 20200013582 - Shimizu; Yuko ; et al.	2020-01-09
Phase plate, method of fabricating same, and electron microscope Grant 9,786,467 - Iijima October 10, 2	2017-10-10
Phase Plate, Method of Fabricating Same, and Electron Microscope App 20160276125 - Iijima; Hirofumi	2016-09-22
Compound microscope device Grant 9,310,596 - Nagayama , et al. April 12, 2	2016-04-12
Image acquisition method and transmission electron microscope Grant 9,196,456 - Iijima November 24, 2	2015-11-24
Image Acquisition Method and Transmission Electron Microscope App 20150136980 - Iijima; Hirofumi	2015-05-21
Phase plate and method of fabricating same Grant 8,829,436 - Iijima , et al. September 9, 2	2014-09-09
Phase Plate and Method of Fabricating Same App 20140183358 - Iijima; Hirofumi ; et al.	2014-07-03
Compound Microscope Device App 20130088775 - Nagayama; Kuniaki ; et al.	2013-04-11

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