IIDA; Mayu

Patent Applications and Registrations

Patent applications and USPTO patent grants for IIDA; Mayu.The latest application filed is for "used secondary battery module management system server, used secondary battery module management system external terminal, and used secondary battery module management system".

Company Profile

0.7.6

IIDA; Mayu - Kariya-city JP
Iida; Mayu - Ohbu N/A JP
Iida; Mayu - Ohbu-shi JP
Iida; Mayu - Aichi JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Used Secondary Battery Module Management System Server, Used Secondary Battery Module Management System External Terminal, And Used Secondary Battery Module Management System App 20220229120 - GOTO; Keisuke ; et al.	2022-07-21
Method for detecting and quantifying endogenous wheat DNA sequence Grant 8,722,397 - Hino , et al. May 13, 2	2014-05-13
Method for detecting and quantifying endogenous wheat DNA sequence Grant 8,652,783 - Hino , et al. February 18, 2	2014-02-18
Method for detecting and quantifying endogenous wheat DNA sequence Grant 8,343,724 - Hino , et al. January 1, 2	2013-01-01
Method for detecting and quantifying endogenous wheat DNA sequence Grant 8,344,117 - Hino , et al. January 1, 2	2013-01-01
Method For Detecting And Quantifying Endogenous Wheat Dna Sequence App 20120040862 - Hino; Akihiro ; et al.	2012-02-16
Method For Detecting And Qunantifying Endogenous Wheat Dna Sequence App 20120009585 - HINO; Akihiro ; et al.	2012-01-12
Method For Detecting And Qunantifying Endogenous Wheat Dna Sequence App 20120009586 - HINO; Akihiro ; et al.	2012-01-12
Method For Detecting And Qunantifying Endogenous Wheat Dna Sequence App 20120009584 - HINO; Akihiro ; et al.	2012-01-12
Method for detecting and quantifying endogenous wheat DNA sequence Grant 8,030,463 - Hino , et al. October 4, 2	2011-10-04
Method for Detecting and Quantifying Endogenous Wheat Dna Sequence App 20090011411 - Hino; Akihiro ; et al.	2009-01-08

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