Ihm; Dong-Chul
Patent Applications and Registrations
Patent applications and USPTO patent grants for Ihm; Dong-Chul.The latest application filed is for "method of predicting shape of semiconductor device".
- Ihm; Dong-Chul - Suwon-si KR
| Patent | Date |
|---|---|
| Method of predicting shape of semiconductor device Grant 11,341,305 - Kim , et al. May 24, 2 | 2022-05-24 |
| Method Of Predicting Shape Of Semiconductor Device App 20200201952 - KIM; KWANG-HOON ; et al. | 2020-06-25 |
| Method for detecting defect of substrate Grant 8,890,069 - Sun , et al. November 18, 2 | 2014-11-18 |
| Apparatuses And Methods For Extracting Defect Depth Information And Methods Of Improving Semiconductor Device Manufacturing Processes Using Defect Depth Information App 20140307052 - Ahn; Jeong-ho ; et al. | 2014-10-16 |
| Method For Detecting Defect Of Substrate App 20140306109 - SUN; Jong-Cheon ; et al. | 2014-10-16 |
| Apparatus And Method For Estimating Depth Of Buried Defect In Substrate App 20140268170 - Sun; Jong-Cheon ; et al. | 2014-09-18 |
uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.
While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.
All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.
| 