Igaku; Yutaka
Patent Applications and Registrations
Patent applications and USPTO patent grants for Igaku; Yutaka.The latest application filed is for "semiconductor apparatus and diagnostic test method".
- Igaku; Yutaka - Tokyo JP
- Igaku; Yutaka - Kawasaki JP
- IGAKU; Yutaka - Kawasaki-shi JP
| Patent | Date |
|---|---|
| Semiconductor apparatus and diagnostic test method Grant 10,761,139 - Shibahara , et al. Sep | 2020-09-01 |
| Control system, relay device and control method Grant 10,576,968 - Yamakoshi , et al. | 2020-03-03 |
| Semiconductor device, diagnostic test, and diagnostic test circuit Grant 10,520,549 - Tsuboi , et al. Dec | 2019-12-31 |
| Semiconductor Apparatus And Diagnostic Test Method App 20190072611 - SHIBAHARA; Shinichi ; et al. | 2019-03-07 |
| Semiconductor apparatus and diagnostic test method Grant 10,151,796 - Shibahara , et al. Dec | 2018-12-11 |
| Semiconductor Device, Diagnostic Test, And Diagnostic Test Circuit App 20180080984 - TSUBOI; Yukitoshi ; et al. | 2018-03-22 |
| Semiconductor device, diagnostic test, and diagnostic test circuit Grant 9,810,738 - Tsuboi , et al. November 7, 2 | 2017-11-07 |
| Control System, Relay Device And Control Method App 20170297570 - YAMAKOSHI; Yasuhiro ; et al. | 2017-10-19 |
| Control system, relay device and control method Grant 9,725,088 - Yamakoshi , et al. August 8, 2 | 2017-08-08 |
| Semiconductor Apparatus And Diagnostic Test Method App 20160349322 - SHIBAHARA; Shinichi ; et al. | 2016-12-01 |
| Control System, Relay Device And Control Method App 20160059853 - YAMAKOSHI; Yasuhiro ; et al. | 2016-03-03 |
| Semiconductor Device, Diagnostic Test, And Diagnostic Test Circuit App 20150293173 - TSUBOI; Yukitoshi ; et al. | 2015-10-15 |
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