Idei; Gijun

Patent Applications and Registrations

Patent applications and USPTO patent grants for Idei; Gijun.The latest application filed is for "calibration device for non-destructive inspection/measurement system and non-destructive inspection/measurement method".

Company Profile

1.6.3

Idei; Gijun - Yokohama JP
IDEI; Gijun - Yokohama-shi JP
Idei; Gijun - Kanagawa JP
Idei; Gijun - Shizuoka-ken JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Calibration device for non-destructive inspection/measurement system and non-destructive inspection/measurement method Grant 10,578,584 - Takakura , et al.	2020-03-03
Calibration Device For Non-destructive Inspection/measurement System And Non-destructive Inspection/measurement Method App 20180095056 - TAKAKURA; Kazuma ; et al.	2018-04-05
Nondestructive inspection device using alternating magnetic field, and nondestructive inspection method Grant 9,453,817 - Nakamura , et al. September 27, 2	2016-09-27
Nondestructive Inspection Device Using Alternating Magnetic Field, And Nondestructive Inspection Method App 20140055130 - NAKAMURA; Kunihiko ; et al.	2014-02-27
Phase comparator and synchronizing signal extracting device Grant 6,633,184 - Idei , et al. October 14, 2	2003-10-14
Phase comparator and synchronizing signal extracting device App 20010043086 - Idei, Gijun ; et al.	2001-11-22
Voltage follower circuit Grant 4,103,248 - Idei July 25, 1	1978-07-25
Constant voltage circuit Grant 4,063,120 - Idei December 13, 1	1977-12-13
Electronic Digital Clock Apparatus Grant 3,788,058 - Idei , et al. January 29, 1	1974-01-29

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