loadpatents
name:-0.07775092124939
name:-0.017026901245117
name:-0.0010828971862793
ICHIZAWA; Yasushi Patent Filings

ICHIZAWA; Yasushi

Patent Applications and Registrations

Patent applications and USPTO patent grants for ICHIZAWA; Yasushi.The latest application filed is for "measurement device and measurement method".

Company Profile
0.14.11
  • ICHIZAWA; Yasushi - Tokyo JP
  • Ichizawa; Yasushi - Musashino JP
  • Ichizawa; Yasushi - Musashino-shi JP
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Measurement Device And Measurement Method
App 20200363340 - SETSUDA; Kazuki ;   et al.
2020-11-19
Material property measuring apparatus
Grant 9,170,194 - Ichizawa , et al. October 27, 2
2015-10-27
Material Property Measuring Apparatus
App 20150090885 - Ichizawa; Yasushi ;   et al.
2015-04-02
Radiation detection apparatus
Grant 8,829,459 - Ichizawa , et al. September 9, 2
2014-09-09
Apparatus for measuring position and shape of pattern formed on sheet
Grant 8,823,819 - Ichizawa , et al. September 2, 2
2014-09-02
Coating dimension measuring apparatus
Grant 8,804,138 - Ichizawa August 12, 2
2014-08-12
Multichannel photometric measurement apparatus
Grant 8,547,544 - Horikoshi , et al. October 1, 2
2013-10-01
Coating Dimension Measuring Apparatus
App 20130201493 - Ichizawa; Yasushi
2013-08-08
X-ray measurement apparatus
Grant 8,488,744 - Ichizawa July 16, 2
2013-07-16
Radiation inspection apparatus comprising a gas ejecting unit for supporting and conveying a sheet-like sample
Grant 8,483,355 - Ichizawa , et al. July 9, 2
2013-07-09
Radiation inspection apparatus
Grant 8,447,012 - Ichizawa , et al. May 21, 2
2013-05-21
Infrared Analysis Apparatus
App 20120218542 - ICHIZAWA; Yasushi ;   et al.
2012-08-30
Apparatus For Measuring Position And Shape Of Pattern Formed On Sheet
App 20120081539 - Ichizawa; Yasushi ;   et al.
2012-04-05
Multichannel Photometric Measurement Apparatus
App 20120019815 - Horikoshi; Kumiko ;   et al.
2012-01-26
Position Measuring System
App 20110273557 - Ichizawa; Yasushi ;   et al.
2011-11-10
Radiation Detection Apparatus
App 20110147603 - ICHIZAWA; Yasushi ;   et al.
2011-06-23
X-ray Measurement Apparatus
App 20110122993 - ICHIZAWA; Yasushi
2011-05-26
Radiation Inspection Apparatus
App 20110069813 - ICHIZAWA; Yasushi ;   et al.
2011-03-24
Radiation Inspection Apparatus
App 20110013748 - ICHIZAWA; Yasushi ;   et al.
2011-01-20

uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.

While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.

All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.

© 2024 USPTO.report | Privacy Policy | Resources | RSS Feed of Trademarks | Trademark Filings Twitter Feed