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Signal processor and signal processing method Grant 11,005,463 - Ichiyama May 11, 2 | 2021-05-11 |
Signal Processor And Signal Processing Method App 20200412350 - ICHIYAMA; Kiyotaka | 2020-12-31 |
Measurement circuit and test apparatus Grant 9,151,801 - Ishida , et al. October 6, 2 | 2015-10-06 |
Test apparatus with voltage margin test Grant 8,896,332 - Ishida , et al. November 25, 2 | 2014-11-25 |
Signal generation apparatus and signal generation method Grant 8,659,330 - Ichiyama February 25, 2 | 2014-02-25 |
Signal Generation Apparatus And Signal Generation Method App 20130249625 - ICHIYAMA; Kiyotaka | 2013-09-26 |
Transmitting System, Receiving System, Transmitting Method, And Receiving Method App 20130170583 - Ichiyama; Kiyotaka ;   et al. | 2013-07-04 |
Test Apparatus And Test Method App 20130147499 - Ishida; Masahiro ;   et al. | 2013-06-13 |
Test Apparatus App 20120323519 - ISHIDA; Masahiro ;   et al. | 2012-12-20 |
Deterministic component model identifying apparatus, identifying method, program, recording medium, test system and electronic device Grant 8,271,219 - Yamaguchi , et al. September 18, 2 | 2012-09-18 |
Measurement Circuit And Test Apparatus App 20120161800 - ISHIDA; Masahiro ;   et al. | 2012-06-28 |
Jitter measurement apparatus, electronic device, and test apparatus Grant 8,204,165 - Ichiyama , et al. June 19, 2 | 2012-06-19 |
Evaluation apparatus, evaluation method, program, recording medium and electronic device Grant 8,175,828 - Ichiyama , et al. May 8, 2 | 2012-05-08 |
Transmission system, transmitter, receiver, and transmission method Grant 8,155,215 - Ichiyama , et al. April 10, 2 | 2012-04-10 |
Jitter measuring apparatus, jitter measuring method and test apparatus Grant 8,068,538 - Ichiyama , et al. November 29, 2 | 2011-11-29 |
Jitter amplifier circuit, signal generation circuit, semiconductor chip, and test apparatus Grant 8,045,605 - Ichiyama , et al. October 25, 2 | 2011-10-25 |
Digital modulator, digital modulating method, digital transceiver system, and testing apparatus Grant 8,014,465 - Ichiyama , et al. September 6, 2 | 2011-09-06 |
Deterministic component model judging apparatus, judging method, program, recording medium, test system and electronic device Grant 8,000,931 - Ichiyama , et al. August 16, 2 | 2011-08-16 |
Calculation apparatus, calculation method, program, recording medium, test system and electronic device Grant 7,971,107 - Ichiyama , et al. June 28, 2 | 2011-06-28 |
Jitter measurement apparatus, jitter measurement method, test apparatus and electronic device Grant 7,957,458 - Ichiyama , et al. June 7, 2 | 2011-06-07 |
Jitter measurement apparatus, jitter measurement method, recording media, communication system and test apparatus Grant 7,945,405 - Ishida , et al. May 17, 2 | 2011-05-17 |
Deterministic component identifying apparatus, identifying, program, recording medium, test system and electronic device Grant 7,917,331 - Ichiyama , et al. March 29, 2 | 2011-03-29 |
Jitter injection circuit, pattern generator, test apparatus, and electronic device Grant 7,904,776 - Ichiyama , et al. March 8, 2 | 2011-03-08 |
Jitter measurement apparatus, jitter calculator, jitter measurement method, program, recording medium, communication system and test apparatus Grant 7,903,776 - Ishida , et al. March 8, 2 | 2011-03-08 |
Phase Detecting Apparatus, Test Apparatus And Adjusting Method App 20100321001 - ICHIYAMA; Kiyotaka | 2010-12-23 |
Transmission system, transmitter, receiver, and transmission method Grant 7,844,020 - Ichiyama November 30, 2 | 2010-11-30 |
Jitter injection circuit, pattern generator, test apparatus, and electronic device Grant 7,834,639 - Ichiyama , et al. November 16, 2 | 2010-11-16 |
Communication system, receiver unit, and adaptive equalizer Grant 7,801,211 - Ichiyama , et al. September 21, 2 | 2010-09-21 |
Jitter measuring apparatus, jitter measuring method and test apparatus Grant 7,778,319 - Ichiyama , et al. August 17, 2 | 2010-08-17 |
Evaluation Apparatus, Evaluation Method, Program, Recording Medium And Electronic Device App 20100185407 - Ichiyama; Kiyotaka ;   et al. | 2010-07-22 |
Delay circuit, jitter injection circuit, and test apparatus Grant 7,724,811 - Ichiyama , et al. May 25, 2 | 2010-05-25 |
Jitter measurement apparatus, jitter measurement method, and recording medium Grant 7,715,512 - Ichiyama , et al. May 11, 2 | 2010-05-11 |
Calculation Apparatus, Calculation Method, Program, Recording Medium, Test System And Electronic Device App 20100107020 - ICHIYAMA; KIYOTAKA ;   et al. | 2010-04-29 |
Deterministic Component Model Judging Apparatus, Judging Method, Program, Recording Medium, Test System And Electronic Device App 20100106457 - ICHIYAMA; KIYOTAKA ;   et al. | 2010-04-29 |
Deterministic Component Model Identifying Apparatus, Identifying Method, Program, Recording Medium, Test System And Electronic Device App 20100106468 - Yamaguchi; Takahiro ;   et al. | 2010-04-29 |
Deterministic Component Identifying Apparatus, Identifying, Program, Recording Medium, Test System And Electronic Device App 20100106470 - ICHIYAMA; KIYOTAKA ;   et al. | 2010-04-29 |
Digital Modulator, Digital Modulating Method, Digital Transceiver System, And Testing Apparatus App 20090304053 - ICHIYAMA; KIYOTAKA ;   et al. | 2009-12-10 |
Jitter Measurement Apparatus, Jitter Measurement Method, Recording Media, Communication System And Test Apparatus App 20090281751 - Ishida; Masahiro ;   et al. | 2009-11-12 |
Jitter Injection Circuit, Pattern Generator, Test Apparatus, And Electronic Device App 20090189667 - ICHIYAMA; KIYOTAKA ;   et al. | 2009-07-30 |
Jitter Injection Circuit, Pattern Generator, Test Apparatus, And Electronic Device App 20090189666 - ICHIYAMA; KIYOTAKA ;   et al. | 2009-07-30 |
Jitter measuring apparatus, jitter measuring method and PLL circuit Grant 7,564,897 - Ichiyama , et al. July 21, 2 | 2009-07-21 |
Calibration apparatus, calibration method, testing apparatus, and testing method Grant 7,554,332 - Ichiyama , et al. June 30, 2 | 2009-06-30 |
Electronic device, testing apparatus, and testing method Grant 7,541,815 - Ichiyama , et al. June 2, 2 | 2009-06-02 |
Transmission System, Transmitter, Receiver, And Transmission Method App 20090103672 - ICHIYAMA; KIYOTAKA ;   et al. | 2009-04-23 |
Oscillator circuit, PLL circuit, semiconductor chip, and test apparatus Grant 7,501,905 - Ichiyama , et al. March 10, 2 | 2009-03-10 |
Apparatus for measuring jitter and method of measuring jitter Grant 7,496,137 - Ichiyama , et al. February 24, 2 | 2009-02-24 |
Communication System, Receiver Unit, And Adaptive Equalizer App 20080310489 - ICHIYAMA; KIYOTAKA ;   et al. | 2008-12-18 |
Signal generation circuit, jitter injection circuit, semiconductor chip and test apparatus Grant 7,466,140 - Ichiyama , et al. December 16, 2 | 2008-12-16 |
Transmission System, Transmitter, Receiver, And Transmission Method App 20080304580 - ICHIYAMA; KIYOTAKA | 2008-12-11 |
Jitter amplifier, jitter amplification method, electronic device, testing apparatus, and testing method Grant 7,412,341 - Ichiyama , et al. August 12, 2 | 2008-08-12 |
Testing apparatus, testing method, jitter filtering circuit, and jitter filtering method Grant 7,394,277 - Ishida , et al. July 1, 2 | 2008-07-01 |
Signal Generation Circuit, Jitter Injection Circuit, Semiconductor Chip And Test Apparatus App 20080150603 - Ichiyama; Kiyotaka ;   et al. | 2008-06-26 |
Jitter Amplifier Circuit, Signal Generation Circuit, Semiconductor Chip, And Test Apparatus App 20080151981 - Ichiyama; Kiyotaka ;   et al. | 2008-06-26 |
Oscillator Circuit, Pll Circuit, Semiconductor Chip, And Test Apparatus App 20080143453 - Ichiyama; Kiyotaka ;   et al. | 2008-06-19 |
Delay Circuit, Jitter Injection Circuit, And Test Apparatus App 20080092000 - Ichiyama; Kiyotaka ;   et al. | 2008-04-17 |
Jitter Measurement Apparatus, Jitter Measurement Method, And Recording Medium App 20080077342 - ICHIYAMA; Kiyotaka ;   et al. | 2008-03-27 |
Testing apparatus, testing method, jitter filtering circuit, and jitter filtering method App 20070247181 - Ishida; Masahiro ;   et al. | 2007-10-25 |
Calibration apparatus, calibration method, testing apparatus, and testing method App 20070236284 - Ichiyama; Kiyotaka ;   et al. | 2007-10-11 |
Jitter amplifier, jitter amplification method, electronic device, testing apparatus, and testing method App 20070239388 - Ichiyama; Kiyotaka ;   et al. | 2007-10-11 |
Electronic device, testing apparatus, and testing method App 20070210802 - Ichiyama; Kiyotaka ;   et al. | 2007-09-13 |
Jitter Measurement Apparatus, Electronic Device, And Test Apparatus App 20070211795 - Ichiyama; Kiyotaka ;   et al. | 2007-09-13 |
Jitter measuring apparatus, jitter measuring method and test apparatus background of the invention App 20070118314 - Ichiyama; Kiyotaka ;   et al. | 2007-05-24 |
Jitter measuring apparatus, jitter measuring method and test apparatus App 20070104260 - Ichiyama; Kiyotaka ;   et al. | 2007-05-10 |
Apparatus for measuring jitter and method of measuring jitter App 20060268970 - Ichiyama; Kiyotaka ;   et al. | 2006-11-30 |
Jitter measurement apparatus, jitter measurement method, test apparatus and electronic device App 20060182170 - Ichiyama; Kiyotaka ;   et al. | 2006-08-17 |
Phase difference detecting apparatus App 20060087346 - Ishida; Masahiro ;   et al. | 2006-04-27 |
Jitter measuring apparatus, jitter measuring method and PLL circuit App 20060018418 - Ichiyama; Kiyotaka ;   et al. | 2006-01-26 |