loadpatents
name:-0.046144008636475
name:-0.056387186050415
name:-0.00067019462585449
Ichiyama; Kiyotaka Patent Filings

Ichiyama; Kiyotaka

Patent Applications and Registrations

Patent applications and USPTO patent grants for Ichiyama; Kiyotaka.The latest application filed is for "signal processor and signal processing method".

Company Profile
0.34.37
  • Ichiyama; Kiyotaka - Saitama JP
  • Ichiyama; Kiyotaka - Gunma JP
  • Ichiyama; Kiyotaka - Tokyo N/A JP
  • Ichiyama; Kiyotaka - Gyoda JP
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Signal processor and signal processing method
Grant 11,005,463 - Ichiyama May 11, 2
2021-05-11
Signal Processor And Signal Processing Method
App 20200412350 - ICHIYAMA; Kiyotaka
2020-12-31
Measurement circuit and test apparatus
Grant 9,151,801 - Ishida , et al. October 6, 2
2015-10-06
Test apparatus with voltage margin test
Grant 8,896,332 - Ishida , et al. November 25, 2
2014-11-25
Signal generation apparatus and signal generation method
Grant 8,659,330 - Ichiyama February 25, 2
2014-02-25
Signal Generation Apparatus And Signal Generation Method
App 20130249625 - ICHIYAMA; Kiyotaka
2013-09-26
Transmitting System, Receiving System, Transmitting Method, And Receiving Method
App 20130170583 - Ichiyama; Kiyotaka ;   et al.
2013-07-04
Test Apparatus And Test Method
App 20130147499 - Ishida; Masahiro ;   et al.
2013-06-13
Test Apparatus
App 20120323519 - ISHIDA; Masahiro ;   et al.
2012-12-20
Deterministic component model identifying apparatus, identifying method, program, recording medium, test system and electronic device
Grant 8,271,219 - Yamaguchi , et al. September 18, 2
2012-09-18
Measurement Circuit And Test Apparatus
App 20120161800 - ISHIDA; Masahiro ;   et al.
2012-06-28
Jitter measurement apparatus, electronic device, and test apparatus
Grant 8,204,165 - Ichiyama , et al. June 19, 2
2012-06-19
Evaluation apparatus, evaluation method, program, recording medium and electronic device
Grant 8,175,828 - Ichiyama , et al. May 8, 2
2012-05-08
Transmission system, transmitter, receiver, and transmission method
Grant 8,155,215 - Ichiyama , et al. April 10, 2
2012-04-10
Jitter measuring apparatus, jitter measuring method and test apparatus
Grant 8,068,538 - Ichiyama , et al. November 29, 2
2011-11-29
Jitter amplifier circuit, signal generation circuit, semiconductor chip, and test apparatus
Grant 8,045,605 - Ichiyama , et al. October 25, 2
2011-10-25
Digital modulator, digital modulating method, digital transceiver system, and testing apparatus
Grant 8,014,465 - Ichiyama , et al. September 6, 2
2011-09-06
Deterministic component model judging apparatus, judging method, program, recording medium, test system and electronic device
Grant 8,000,931 - Ichiyama , et al. August 16, 2
2011-08-16
Calculation apparatus, calculation method, program, recording medium, test system and electronic device
Grant 7,971,107 - Ichiyama , et al. June 28, 2
2011-06-28
Jitter measurement apparatus, jitter measurement method, test apparatus and electronic device
Grant 7,957,458 - Ichiyama , et al. June 7, 2
2011-06-07
Jitter measurement apparatus, jitter measurement method, recording media, communication system and test apparatus
Grant 7,945,405 - Ishida , et al. May 17, 2
2011-05-17
Deterministic component identifying apparatus, identifying, program, recording medium, test system and electronic device
Grant 7,917,331 - Ichiyama , et al. March 29, 2
2011-03-29
Jitter injection circuit, pattern generator, test apparatus, and electronic device
Grant 7,904,776 - Ichiyama , et al. March 8, 2
2011-03-08
Jitter measurement apparatus, jitter calculator, jitter measurement method, program, recording medium, communication system and test apparatus
Grant 7,903,776 - Ishida , et al. March 8, 2
2011-03-08
Phase Detecting Apparatus, Test Apparatus And Adjusting Method
App 20100321001 - ICHIYAMA; Kiyotaka
2010-12-23
Transmission system, transmitter, receiver, and transmission method
Grant 7,844,020 - Ichiyama November 30, 2
2010-11-30
Jitter injection circuit, pattern generator, test apparatus, and electronic device
Grant 7,834,639 - Ichiyama , et al. November 16, 2
2010-11-16
Communication system, receiver unit, and adaptive equalizer
Grant 7,801,211 - Ichiyama , et al. September 21, 2
2010-09-21
Jitter measuring apparatus, jitter measuring method and test apparatus
Grant 7,778,319 - Ichiyama , et al. August 17, 2
2010-08-17
Evaluation Apparatus, Evaluation Method, Program, Recording Medium And Electronic Device
App 20100185407 - Ichiyama; Kiyotaka ;   et al.
2010-07-22
Delay circuit, jitter injection circuit, and test apparatus
Grant 7,724,811 - Ichiyama , et al. May 25, 2
2010-05-25
Jitter measurement apparatus, jitter measurement method, and recording medium
Grant 7,715,512 - Ichiyama , et al. May 11, 2
2010-05-11
Calculation Apparatus, Calculation Method, Program, Recording Medium, Test System And Electronic Device
App 20100107020 - ICHIYAMA; KIYOTAKA ;   et al.
2010-04-29
Deterministic Component Model Judging Apparatus, Judging Method, Program, Recording Medium, Test System And Electronic Device
App 20100106457 - ICHIYAMA; KIYOTAKA ;   et al.
2010-04-29
Deterministic Component Model Identifying Apparatus, Identifying Method, Program, Recording Medium, Test System And Electronic Device
App 20100106468 - Yamaguchi; Takahiro ;   et al.
2010-04-29
Deterministic Component Identifying Apparatus, Identifying, Program, Recording Medium, Test System And Electronic Device
App 20100106470 - ICHIYAMA; KIYOTAKA ;   et al.
2010-04-29
Digital Modulator, Digital Modulating Method, Digital Transceiver System, And Testing Apparatus
App 20090304053 - ICHIYAMA; KIYOTAKA ;   et al.
2009-12-10
Jitter Measurement Apparatus, Jitter Measurement Method, Recording Media, Communication System And Test Apparatus
App 20090281751 - Ishida; Masahiro ;   et al.
2009-11-12
Jitter Injection Circuit, Pattern Generator, Test Apparatus, And Electronic Device
App 20090189667 - ICHIYAMA; KIYOTAKA ;   et al.
2009-07-30
Jitter Injection Circuit, Pattern Generator, Test Apparatus, And Electronic Device
App 20090189666 - ICHIYAMA; KIYOTAKA ;   et al.
2009-07-30
Jitter measuring apparatus, jitter measuring method and PLL circuit
Grant 7,564,897 - Ichiyama , et al. July 21, 2
2009-07-21
Calibration apparatus, calibration method, testing apparatus, and testing method
Grant 7,554,332 - Ichiyama , et al. June 30, 2
2009-06-30
Electronic device, testing apparatus, and testing method
Grant 7,541,815 - Ichiyama , et al. June 2, 2
2009-06-02
Transmission System, Transmitter, Receiver, And Transmission Method
App 20090103672 - ICHIYAMA; KIYOTAKA ;   et al.
2009-04-23
Oscillator circuit, PLL circuit, semiconductor chip, and test apparatus
Grant 7,501,905 - Ichiyama , et al. March 10, 2
2009-03-10
Apparatus for measuring jitter and method of measuring jitter
Grant 7,496,137 - Ichiyama , et al. February 24, 2
2009-02-24
Communication System, Receiver Unit, And Adaptive Equalizer
App 20080310489 - ICHIYAMA; KIYOTAKA ;   et al.
2008-12-18
Signal generation circuit, jitter injection circuit, semiconductor chip and test apparatus
Grant 7,466,140 - Ichiyama , et al. December 16, 2
2008-12-16
Transmission System, Transmitter, Receiver, And Transmission Method
App 20080304580 - ICHIYAMA; KIYOTAKA
2008-12-11
Jitter amplifier, jitter amplification method, electronic device, testing apparatus, and testing method
Grant 7,412,341 - Ichiyama , et al. August 12, 2
2008-08-12
Testing apparatus, testing method, jitter filtering circuit, and jitter filtering method
Grant 7,394,277 - Ishida , et al. July 1, 2
2008-07-01
Signal Generation Circuit, Jitter Injection Circuit, Semiconductor Chip And Test Apparatus
App 20080150603 - Ichiyama; Kiyotaka ;   et al.
2008-06-26
Jitter Amplifier Circuit, Signal Generation Circuit, Semiconductor Chip, And Test Apparatus
App 20080151981 - Ichiyama; Kiyotaka ;   et al.
2008-06-26
Oscillator Circuit, Pll Circuit, Semiconductor Chip, And Test Apparatus
App 20080143453 - Ichiyama; Kiyotaka ;   et al.
2008-06-19
Delay Circuit, Jitter Injection Circuit, And Test Apparatus
App 20080092000 - Ichiyama; Kiyotaka ;   et al.
2008-04-17
Jitter Measurement Apparatus, Jitter Measurement Method, And Recording Medium
App 20080077342 - ICHIYAMA; Kiyotaka ;   et al.
2008-03-27
Testing apparatus, testing method, jitter filtering circuit, and jitter filtering method
App 20070247181 - Ishida; Masahiro ;   et al.
2007-10-25
Calibration apparatus, calibration method, testing apparatus, and testing method
App 20070236284 - Ichiyama; Kiyotaka ;   et al.
2007-10-11
Jitter amplifier, jitter amplification method, electronic device, testing apparatus, and testing method
App 20070239388 - Ichiyama; Kiyotaka ;   et al.
2007-10-11
Electronic device, testing apparatus, and testing method
App 20070210802 - Ichiyama; Kiyotaka ;   et al.
2007-09-13
Jitter Measurement Apparatus, Electronic Device, And Test Apparatus
App 20070211795 - Ichiyama; Kiyotaka ;   et al.
2007-09-13
Jitter measuring apparatus, jitter measuring method and test apparatus background of the invention
App 20070118314 - Ichiyama; Kiyotaka ;   et al.
2007-05-24
Jitter measuring apparatus, jitter measuring method and test apparatus
App 20070104260 - Ichiyama; Kiyotaka ;   et al.
2007-05-10
Apparatus for measuring jitter and method of measuring jitter
App 20060268970 - Ichiyama; Kiyotaka ;   et al.
2006-11-30
Jitter measurement apparatus, jitter measurement method, test apparatus and electronic device
App 20060182170 - Ichiyama; Kiyotaka ;   et al.
2006-08-17
Phase difference detecting apparatus
App 20060087346 - Ishida; Masahiro ;   et al.
2006-04-27
Jitter measuring apparatus, jitter measuring method and PLL circuit
App 20060018418 - Ichiyama; Kiyotaka ;   et al.
2006-01-26

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