ICHIOKA; Yoshikazu

Patent Applications and Registrations

Patent applications and USPTO patent grants for ICHIOKA; Yoshikazu.The latest application filed is for "printing apparatus and a printing method".

Company Profile

3.6.9

ICHIOKA; Yoshikazu - Kyoto JP
ICHIOKA; Yoshikazu - Kyoto-shi JP
Ichioka; Yoshikazu - Fujisawa JP
Ichioka; Yoshikazu - Himeji JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Printing Apparatus And A Printing Method App 20220297447 - ICHIOKA; Yoshikazu	2022-09-22
Inspecting Apparatus, And An Inkjet Printing Apparatus Having The Same App 20220090967 - Ichioka; Yoshikazu ; et al.	2022-03-24
Image recording apparatus, image recording method, and correction information acquisition method Grant 11,100,377 - Ichioka August 24, 2	2021-08-24
Data Processing Method, Data Recording Method, Flexible Packaging Manufacturing Method, And Image Recording Apparatus App 20210051239 - ICHIOKA; Yoshikazu ; et al.	2021-02-18
Inspection Device, Inkjet Printing Apparatus, And Inspection Method App 20210033463 - ICHIOKA; Yoshikazu	2021-02-04
Image Recording Apparatus, Image Recording Method, And Correction Information Acquisition Method App 20200410307 - Ichioka; Yoshikazu	2020-12-31
Inkjet printing apparatus and variable-density correction method Grant 10,421,290 - Ichioka Sept	2019-09-24
Inkjet Printing Apparatus And Variable-density Correction Method App 20190092039 - ICHIOKA; Yoshikazu	2019-03-28
Inkjet Printer And Inkjet Printing Method App 20180272745 - ICHIOKA; YOSHIKAZU	2018-09-27
Generating a threshold matrix to be compared with an original image for performing halftoning of the original image Grant 9,189,716 - Takahama , et al. November 17, 2	2015-11-17
Threshold Matrix Generation Method, Image Data Generation Method, Image Recording Apparatus, And Recording Medium App 20140293298 - TAKAHAMA; Ikuhiko ; et al.	2014-10-02
Method for creating charged-particle-beam exposure data, method for manufacturing semiconductor device, and program Grant 7,076,761 - Inanami , et al. July 11, 2	2006-07-11
Method for creating charged-particle-beam exposure data, method for manufacturing semiconductor device, and program App 20040117757 - Inanami, Ryouichi ; et al.	2004-06-17
Array tester for determining contact quality and line integrity in a TFT/LCD Grant 5,546,013 - Ichioka , et al. August 13, 1	1996-08-13
Liquid crystal device with shorting ring and transistors for electrostatic discharge protection Grant 5,373,377 - Ogawa , et al. December 13, 1	1994-12-13

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