Ichihashi; Mikio
Patent Applications and Registrations
Patent applications and USPTO patent grants for Ichihashi; Mikio.The latest application filed is for "electron microscope".
Company Profile
0.32.16
- Ichihashi; Mikio - Kodaira JP
- Ichihashi; Mikio - Kodaira-shi JP
- Ichihashi; Mikio - Nagoya JP
- Ichihashi; Mikio - Hashima JP
- Ichihashi; Mikio - Kodaria JP
- Ichihashi; Mikio - Hashima-City JP
- Ichihashi; Mikio - Katsuta JP
Patent Activity
| Patent | Date |
|---|---|
| Electron gun Grant 8,669,535 - Ichihashi , et al. March 11, 2 | 2014-03-11 |
| Method and an apparatus of an inspection system using an electron beam Grant 8,604,430 - Iwabuchi , et al. December 10, 2 | 2013-12-10 |
| Electron Microscope App 20130087703 - Onishi; Takashi ; et al. | 2013-04-11 |
| Method And An Apparatus Of An Inspection System Using An Electron Beam App 20120132801 - IWABUCHI; Yuko ; et al. | 2012-05-31 |
| Electron Gun App 20120062094 - Ichihashi; Mikio ; et al. | 2012-03-15 |
| Method and apparatus of an inspection system using an electron beam Grant 8,134,125 - Iwabuchi , et al. March 13, 2 | 2012-03-13 |
| Method And Apparatus Of An Inspection System Using An Electron Beam App 20090057556 - Iwabuchi; Yuko ; et al. | 2009-03-05 |
| Method and an apparatus of an inspection system using an electron beam Grant 7,439,506 - Iwabuchi , et al. October 21, 2 | 2008-10-21 |
| Method and apparatus for measuring the physical properties of micro region Grant 7,385,198 - Taniguchi , et al. June 10, 2 | 2008-06-10 |
| Beam irradiation device Grant 7,351,944 - Yamada , et al. April 1, 2 | 2008-04-01 |
| Method and an apparatus of an inspection system using an electron beam App 20070215803 - Iwabuchi; Yuko ; et al. | 2007-09-20 |
| Method and an apparatus of an inspection system using an electron beam Grant 7,232,996 - Iwabuchi , et al. June 19, 2 | 2007-06-19 |
| Method and an apparatus of an inspection system using an electron beam App 20060151699 - Iwabuchi; Yuko ; et al. | 2006-07-13 |
| Beam irradiation device App 20060113462 - Yamada; Masato ; et al. | 2006-06-01 |
| Method and apparatus for measuring the physical properties of micro region App 20060113473 - Taniguchi; Yoshifumi ; et al. | 2006-06-01 |
| Method and apparatus for measuring physical properties of micro region Grant 7,022,988 - Taniguchi , et al. April 4, 2 | 2006-04-04 |
| Method and an apparatus of an inspection system using an electron beam Grant 7,012,252 - Iwabuchi , et al. March 14, 2 | 2006-03-14 |
| Method and an apparatus of an inspection system using an electron beam Grant 6,987,265 - Iwabuchi , et al. January 17, 2 | 2006-01-17 |
| Method and an apparatus of an inspection system using an electron beam App 20050205782 - Iwabuchi, Yuko ; et al. | 2005-09-22 |
| Method and apparatus for scanning transmission electron microscopy Grant 6,822,233 - Nakamura , et al. November 23, 2 | 2004-11-23 |
| Observation apparatus and observation method using an electron beam Grant 6,750,451 - Koguchi , et al. June 15, 2 | 2004-06-15 |
| Method and apparatus for measuring physical properties of micro region App 20040061053 - Taniguchi, Yoshifumi ; et al. | 2004-04-01 |
| Method and apparatus for scanning transmission electron microscopy App 20030127595 - Nakamura, Kuniyasu ; et al. | 2003-07-10 |
| Method and apparatus for scanning transmission electron microscopy Grant 6,531,697 - Nakamura , et al. March 11, 2 | 2003-03-11 |
| Method and apparatus for inspecting patterns of a semiconductor device with an electron beam Grant 6,512,227 - Iwabuchi , et al. January 28, 2 | 2003-01-28 |
| Observation apparatus and observation method using an electron beam App 20030006373 - Koguchi, Masanari ; et al. | 2003-01-09 |
| Method and an apparatus of an inspection system using an electron beam Grant 6,452,178 - Iwabuchi , et al. September 17, 2 | 2002-09-17 |
| Method and an apparatus of an inspection system using an electron beam App 20020092986 - Iwabuchi, Yuko ; et al. | 2002-07-18 |
| Method and apparatus for inspecting patterns of a semiconductor device with an electron beam App 20020024021 - Iwabuchi, Yuko ; et al. | 2002-02-28 |
| Method and an apparatus of an inspection system using an electron beam Grant 6,348,690 - Iwabuchi , et al. February 19, 2 | 2002-02-19 |
| Method and an apparatus of an inspection system using an electron beam App 20010030294 - Iwabuchi, Yuko ; et al. | 2001-10-18 |
| Electron microscope Grant 6,051,834 - Kakibayashi , et al. April 18, 2 | 2000-04-18 |
| Electron microscope Grant 5,866,905 - Kakibayashi , et al. February 2, 1 | 1999-02-02 |
| Electron microscope Grant 5,552,602 - Kakibayashi , et al. September 3, 1 | 1996-09-03 |
| Electron lens Grant 5,442,182 - Kubo , et al. August 15, 1 | 1995-08-15 |
| Charged particle beam apparatus Grant 5,324,950 - Otaka , et al. June 28, 1 | 1994-06-28 |
| Charged particle beam apparatus having particular electrostatic objective lens and vacuum pump systems Grant 5,254,856 - Matsui , et al. October 19, 1 | 1993-10-19 |
| Charged particle beam apparatus Grant 5,187,371 - Matsui , et al. February 16, 1 | 1993-02-16 |
| Electron microscope and method for observing microscopic image Grant 5,153,434 - Yajima , et al. October 6, 1 | 1992-10-06 |
| Electron beam metrology system Grant 4,767,926 - Murakoshi , et al. August 30, 1 | 1988-08-30 |
| Electron beam metrology system Grant 4,751,384 - Murakoshi , et al. June 14, 1 | 1988-06-14 |
| Electron beam pattern line width measurement system Grant 4,740,693 - Nakayama , et al. April 26, 1 | 1988-04-26 |
| Charged particle beam microprobe apparatus Grant 4,670,652 - Ichihashi , et al. June 2, 1 | 1987-06-02 |
| Apparatus for focusing a charged particle beam onto a specimen Grant 4,605,860 - Fukuhara , et al. August 12, 1 | 1986-08-12 |
| Small-dimension measurement system by scanning electron beam Grant 4,600,839 - Ichihashi , et al. July 15, 1 | 1986-07-15 |
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