Ichihara; Masaru
Patent Applications and Registrations
Patent applications and USPTO patent grants for Ichihara; Masaru.The latest application filed is for "x-ray inspection apparatus and x-ray inspection method".
- Ichihara; Masaru - Ashiya JP
- Ichihara, Masaru - Ashiya-shi JP
- Ichihara; Masaru - Osaka-fu JP
- Ichihara; Masaru - Kadoma JP
| Patent | Date |
|---|---|
| X-ray inspection apparatus and X-ray inspection method Grant 7,099,432 - Ichihara , et al. August 29, 2 | 2006-08-29 |
| Component mounting control method Grant 7,051,431 - Ueda , et al. May 30, 2 | 2006-05-30 |
| X-ray inspection apparatus and X-ray inspection method App 20050074088 - Ichihara, Masaru ; et al. | 2005-04-07 |
| Connection inspecting apparatus, connection inspecting method, and recording medium for recording programs executing the method Grant 6,872,949 - Mizuoka , et al. March 29, 2 | 2005-03-29 |
| Component mounting control method App 20040049758 - Ueda, Yoichiro ; et al. | 2004-03-11 |
| Connection inspecting apparatus, connection inspecting method, and recording medium for recording programs executing the method App 20010040217 - Mizuoka, Seiji ; et al. | 2001-11-15 |
| Method and apparatus for mounting electronic component Grant 5,854,745 - Muraoka , et al. December 29, 1 | 1998-12-29 |
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