Ibraimov; Nariman S.
Patent Applications and Registrations
Patent applications and USPTO patent grants for Ibraimov; Nariman S..The latest application filed is for "detecting unit for x-ray diffraction measurements".
- Ibraimov; Nariman S. - Moscow RU
| Patent | Date |
|---|---|
| Detecting unit for X-ray diffraction measurements Grant 7,149,279 - Kumakhov , et al. December 12, 2 | 2006-12-12 |
| Method for determination of elastic strains present in single-crystal wafers and device for its realization Grant 7,116,753 - Kumakhov , et al. October 3, 2 | 2006-10-03 |
| Method for determination of elastic strains present in single-crystal wafers and device for its realization App 20050041777 - Kumakhov, Muradin A. ; et al. | 2005-02-24 |
| Detecting unit for X-ray diffraction measurements App 20050041776 - Kumakhov, Muradin A. ; et al. | 2005-02-24 |
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