Hyun; Ji-Hwan
Patent Applications and Registrations
Patent applications and USPTO patent grants for Hyun; Ji-Hwan.The latest application filed is for "circuit of measuring leakage current in a semiconductor integrated circuit".
- Hyun; Ji-Hwan - Daegu KR
- Hyun; Ji-Hwan - Buk-gu KR
| Patent | Date |
|---|---|
| Circuit of measuring leakage current in a semiconductor integrated circuit Grant 9,632,126 - Yoon , et al. April 25, 2 | 2017-04-25 |
| Circuit Of Measuring Leakage Current In A Semiconductor Integrated Circuit App 20150233996 - Yoon; Kun-Yong ; et al. | 2015-08-20 |
| Sealed crystal oscillator and semiconductor package including the same Grant 9,048,808 - Park , et al. June 2, 2 | 2015-06-02 |
| Method Of Operating Oscillator Including Verification Of Operation Of The Oscillator App 20150120257 - PARK; Jae-Jin ; et al. | 2015-04-30 |
| Sealed Crystal Oscillator And Semiconductor Package Including The Same App 20140232477 - Park; Jae-Jin ; et al. | 2014-08-21 |
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