Hyakudomi; Takanori

Patent Applications and Registrations

Patent applications and USPTO patent grants for Hyakudomi; Takanori.The latest application filed is for "testing system".

Company Profile

2.9.9

Hyakudomi; Takanori - Nirasaki JP
HYAKUDOMI; Takanori - Nirasaki City Yamanashi
Hyakudomi; Takanori - Yamanashi JP
Hyakudomi; Takanori - Nirasaki-shi JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Testing system Grant 11,454,664 - Konishi , et al. September 27, 2	2022-09-27
Inspection system Grant 11,360,115 - Hyakudomi , et al. June 14, 2	2022-06-14
Testing System App 20210333319 - KONISHI; Kentaro ; et al.	2021-10-28
Inspection device and contact method Grant 11,099,236 - Hyakudomi , et al. August 24, 2	2021-08-24
Detection Device And Contact Method App 20200033404 - HYAKUDOMI; Takanori ; et al.	2020-01-30
Inspection System App 20190265272 - Hyakudomi; Takanori ; et al.	2019-08-29
Method of contacting substrate with probe card Grant 9,863,977 - Furuya , et al. January 9, 2	2018-01-09
Method Of Contacting Substrate With Probe Card App 20150219687 - Furuya; Kunihiro ; et al.	2015-08-06
Inspection method, inspection apparatus, and control program for performing electrical inspection by using probe Grant 7,679,387 - Hyakudomi March 16, 2	2010-03-16
Probing apparatus and positional deviation acquiring method Grant 7,477,064 - Kurihara , et al. January 13, 2	2009-01-13
Inspection Method, Inspection Apparatus and Control Program App 20090002008 - Hyakudomi; Takanori	2009-01-01
Detection method/device of probe's tip location using a transparent film attached to a substate having plurality of electrodes, and a storage medium for implementing the method Grant 7,397,257 - Kobayashi , et al. July 8, 2	2008-07-08
Detection Method Of Probe's Tip Location, Storage Medium Storing The Method, And Probe Device App 20070229098 - KOBAYASHI; Masahito ; et al.	2007-10-04
Probe apparatus with optical length-measuring unit and probe testing method Grant 7,221,177 - Komatsu , et al. May 22, 2	2007-05-22
Probing apparatus and positional deviation acquiring method App 20060238905 - Kurihara; Daiki ; et al.	2006-10-26
Probe apparatus with optical length-measuring unit and probe testing method App 20050253613 - Komatsu, Shigekazu ; et al.	2005-11-17
Method of delivering target object to be processed, table mechanism of target object and probe apparatus Grant 6,739,208 - Hyakudomi May 25, 2	2004-05-25
Method of delivering target object to be processed, table mechanism of target object and probe apparatus App 20020044864 - Hyakudomi, Takanori	2002-04-18

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