Hwang; Yin-Chao
Patent Applications and Registrations
Patent applications and USPTO patent grants for Hwang; Yin-Chao.The latest application filed is for "test circuit and scan tested logic device with isolated data lines during testing".
- Hwang; Yin-Chao - Sugar Land TX
| Patent | Date |
|---|---|
| Test circuit and scan tested logic device with isolated data lines during testing Grant 5,032,783 - Hwang , et al. July 16, 1 | 1991-07-16 |
| Parallel/serial scan system for testing logic circuits Grant 4,710,933 - Powell , et al. December 1, 1 | 1987-12-01 |
| Modularized scan path for serially tested logic circuit Grant 4,701,921 - Powell , et al. October 20, 1 | 1987-10-20 |
| Transparent shift register latch for isolating peripheral ports during scan testing of a logic circuit Grant 4,698,588 - Hwang , et al. October 6, 1 | 1987-10-06 |
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