Hwang; Shiow-Hwei

Patent Applications and Registrations

Patent applications and USPTO patent grants for Hwang; Shiow-Hwei.The latest application filed is for "inspection system including parallel imaging paths with multiple and selectable spectral bands".

Company Profile

1.17.13

Hwang; Shiow-Hwei - San Ramon CA
Hwang; Shiow-Hwei - Livermore CA

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Inspection system including parallel imaging paths with multiple and selectable spectral bands Grant 10,429,319 - Hwang , et al. October 1, 2	2019-10-01
Optical imaging system with catoptric objective; broadband objective with mirror; and refractive lenses and broadband optical imaging system having two or more imaging paths Grant 9,052,494 - Hwang , et al. June 9, 2	2015-06-09
Inspection System Including Parallel Imaging Paths with Multiple and Selectable Spectral Bands App 20140285657 - Hwang; Shiow-Hwei ; et al.	2014-09-25
Optical imaging system with laser droplet plasma illuminator Grant 8,575,576 - Solarz , et al. November 5, 2	2013-11-05
Optical Imaging System With Catoptric Objective; Broadband Objective With Mirror; And Refractive Lenses And Broadband Optical Imaging System Having Two Or More Imaging Paths App 20130155399 - Hwang; Shiow-Hwei ; et al.	2013-06-20
Methods and systems for inspection of a specimen using different inspection parameters Grant 8,384,887 - Lange , et al. February 26, 2	2013-02-26
Systems configured to generate output corresponding to defects on a specimen Grant 8,355,140 - Hwang , et al. January 15, 2	2013-01-15
Optical Imaging System With Laser Droplet Plasma Illuminator App 20120205546 - Solarz; Richard W. ; et al.	2012-08-16
Image collection Grant 8,178,860 - Kirk , et al. May 15, 2	2012-05-15
Optical Imaging System With Catoptric Objective; Broadband Objective With Mirror; And Refractive Lenses And Broadband Optical Imaging System Having Two Or More Imaging Paths App 20110242528 - Hwang; Shiow-Hwei ; et al.	2011-10-06
Systems Configured to Generate Output Corresponding to Defects on a Specimen App 20110181891 - Hwang; Shiow-Hwei ; et al.	2011-07-28
Systems configured to generate output corresponding to defects on a specimen Grant 7,924,434 - Hwang , et al. April 12, 2	2011-04-12
Image Collection App 20110043797 - Kirk; Gregory L. ; et al.	2011-02-24
Methods And Systems For Inspection Of A Specimen Using Different Inspection Parameters App 20100238433 - Lange; Steve R. ; et al.	2010-09-23
Methods and systems for inspection of a specimen using different inspection parameters Grant 7,738,089 - Lange , et al. June 15, 2	2010-06-15
System and method for coherent optical inspection Grant 7,327,464 - Hwang , et al. February 5, 2	2008-02-05
System And Method For Coherent Optical Inspection App 20070195332 - Hwang; Shiow-Hwei ; et al.	2007-08-23
System and method for performing bright field and dark field optical inspection Grant 7,259,869 - Hwang , et al. August 21, 2	2007-08-21
System and method for coherent optical inspection Grant 7,209,239 - Hwang , et al. April 24, 2	2007-04-24
Systems Configured to Generate Output Corresponding to Defects on a Specimen App 20070030477 - Hwang; Shiow-Hwei ; et al.	2007-02-08
Method and apparatus using microscopic and interferometric based detection Grant 7,095,507 - Hwang , et al. August 22, 2	2006-08-22
Method and apparatus using interferometric metrology for high aspect ratio inspection Grant 7,061,625 - Hwang , et al. June 13, 2	2006-06-13
System and method for performing bright field and dark field optical inspection App 20060007448 - Hwang; Shiow-Hwei ; et al.	2006-01-12
Methods and systems for inspection of a specimen using different inspection parameters App 20050052643 - Lange, Steve R. ; et al.	2005-03-10
System and method for coherent optical inspection App 20040130710 - Hwang, Shiow-Hwei ; et al.	2004-07-08

uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.

While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.

All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.