Hwang; Bong-Ha
Patent Applications and Registrations
Patent applications and USPTO patent grants for Hwang; Bong-Ha.The latest application filed is for "method of inpsecting a substrate".
- Hwang; Bong-Ha - Seoul N/A KR
- Hwang; Bong-Ha - Incheon KR
| Patent | Date |
|---|---|
| Method of inspecting a substrate Grant 9,885,669 - Cho , et al. February 6, 2 | 2018-02-06 |
| Inspection method Grant 9,664,628 - Cho , et al. May 30, 2 | 2017-05-30 |
| Board inspection apparatus and method Grant 9,470,752 - Jeong , et al. October 18, 2 | 2016-10-18 |
| Method of measuring a three-dimensional shape Grant 9,101,055 - Kim , et al. August 4, 2 | 2015-08-04 |
| Inspection method Grant 9,092,843 - Hwang July 28, 2 | 2015-07-28 |
| Board inspection apparatus and method Grant 9,091,725 - Jeong , et al. July 28, 2 | 2015-07-28 |
| Inspection method Grant 8,949,060 - Hwang February 3, 2 | 2015-02-03 |
| Method Of Inpsecting A Substrate App 20140009601 - Cho; Soo-Young ; et al. | 2014-01-09 |
| Method Of Measuring A Three-dimensional Shape App 20130229509 - KIM; Min-Young ; et al. | 2013-09-05 |
| Board Inspection Apparatus And Method App 20130215262 - JEONG; Joong-Ki ; et al. | 2013-08-22 |
| Method of measuring a three-dimensional shape Grant 8,437,533 - Kim , et al. May 7, 2 | 2013-05-07 |
| Inspection method Grant 8,260,030 - Kim , et al. September 4, 2 | 2012-09-04 |
| Inspection Method App 20120128231 - HWANG; Bong-Ha | 2012-05-24 |
| Inspection Method App 20120130666 - Cho; Soo-Young ; et al. | 2012-05-24 |
| Inspection Method App 20120123719 - HWANG; Bong-Ha | 2012-05-17 |
| Board Inspection Apparatus And Method App 20110002527 - JEONG; Joong-Ki ; et al. | 2011-01-06 |
| Inspection Method App 20100246931 - KIM; Hee-Tae ; et al. | 2010-09-30 |
| Method Of Measuring A Three-dimensional Shape App 20100092041 - KIM; Min-Young ; et al. | 2010-04-15 |
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