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Patent applications and USPTO patent grants for Huynh; Van C..The latest application filed is for "memory device tester and method for testing reduced power states".
Patent | Date |
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Memory device tester and method for testing reduced power states Grant 7,161,866 - Harrington , et al. January 9, 2 | 2007-01-09 |
Memory device tester and method for testing reduced power states App 20050243638 - Harrington, Matthew R. ;   et al. | 2005-11-03 |
Memory device tester and method for testing reduced power states Grant 6,914,843 - Harrington , et al. July 5, 2 | 2005-07-05 |
Memory device tester and method for testing reduced power states Grant 6,775,192 - Harrington , et al. August 10, 2 | 2004-08-10 |
Memory device tester and method for testing reduced power states Grant 6,674,677 - Harrington , et al. January 6, 2 | 2004-01-06 |
Memory device tester and method for testing reduced power states App 20020190708 - Harrington, Matthew R. ;   et al. | 2002-12-19 |
Memory device tester and method for testing reduced power states App 20020149982 - Harrington, Matthew R. ;   et al. | 2002-10-17 |
Memory device tester and method for testing reduced power states App 20020149981 - Harrington, Matthew R. ;   et al. | 2002-10-17 |
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