| Patent | Date |
|---|
Word Line Leakage Detection Using Source And Sink Currents
App 20190006019 - Wang; Sung-En ; et al. | 2019-01-03 |
High accuracy leakage detection through low voltage biasing
Grant 10,008,276 - Huynh , et al. June 26, 2 | 2018-06-26 |
Fast scan to detect bit line discharge time
Grant 9,892,791 - Li , et al. February 13, 2 | 2018-02-13 |
High Accuracy Leakage Detection Through Low Voltage Biasing
App 20170316834 - Huynh; Jonathan ; et al. | 2017-11-02 |
Charge pump based over-sampling with uniform step size for current detection
Grant 9,698,676 - Huynh , et al. July 4, 2 | 2017-07-04 |
Charge pump strength calibration and screening in circuit design
Grant 9,553,506 - Huynh , et al. January 24, 2 | 2017-01-24 |
Fast Scan To Detect Bit Line Discharge Time
App 20160372200 - Li; Yen-Lung ; et al. | 2016-12-22 |
Multi-clock generation through phase locked loop (PLL) reference
Grant 9,514,831 - Huynh , et al. December 6, 2 | 2016-12-06 |
Single ended word line and bit line time constant measurement
Grant 9,418,750 - Wang , et al. August 16, 2 | 2016-08-16 |
Self-adjusting regulation current for memory array source line
Grant 9,368,224 - Wang , et al. June 14, 2 | 2016-06-14 |
High voltage step down regulator with breakdown protection
Grant 9,330,776 - Huynh , et al. May 3, 2 | 2016-05-03 |
Methods and apparatus for clock oscillator temperature coefficient trimming
Grant 9,325,276 - Huynh , et al. April 26, 2 | 2016-04-26 |
Digitally controlled source side select gate offset in 3D NAND memory erase
Grant 9,318,209 - Huynh , et al. April 19, 2 | 2016-04-19 |
Single Ended Word Line and Bit Line Time Constant Measurement
App 20160078958 - Wang; Sung-En ; et al. | 2016-03-17 |
High Voltage Step Down Regulator with Breakdown Protection
App 20160049206 - Huynh; Jonathan ; et al. | 2016-02-18 |
Cell current control through power supply
Grant 9,208,895 - Huynh , et al. December 8, 2 | 2015-12-08 |
Dynamic load matching charge pump for reduced current consumption
Grant 9,154,027 - Huynh , et al. October 6, 2 | 2015-10-06 |
Methods and Apparatus for Clock Oscillator Temperature Coefficient Trimming
App 20150249428 - Huynh; Jonathan ; et al. | 2015-09-03 |
Self-Adjusting Regulation Current for Memory Array Source Line
App 20150228351 - Wang; Sung-En ; et al. | 2015-08-13 |
Multi-Clock Generation Through Phase Locked Loop (PLL) Reference
App 20150214964 - Huynh; Jonathan ; et al. | 2015-07-30 |
Amplitude modulation for pass gate to improve charge pump efficiency
Grant 9,083,231 - Pan , et al. July 14, 2 | 2015-07-14 |
Dynamic Load Matching Charge Pump for Reduced Current Consumption
App 20150162825 - Huynh; Jonathan ; et al. | 2015-06-11 |
Amplitude Modulation for Pass Gate to Improve Charge Pump Efficiency
App 20150091637 - Pan; Feng ; et al. | 2015-04-02 |
Charge pump system dynamically reconfigurable for read and program
Grant 8,699,247 - Nguyen , et al. April 15, 2 | 2014-04-15 |
Dynamic switching approach to reduce area and power consumption of high voltage charge pumps
Grant 8,514,628 - Nguyen , et al. August 20, 2 | 2013-08-20 |
Detection of word-line leakage in memory arrays
Grant 8,432,732 - Li , et al. April 30, 2 | 2013-04-30 |
Dynamic Switching Approach to Reduce Area and Power Consumption of High Voltage Charge Pumps
App 20130077411 - Nguyen; Qui Vi ; et al. | 2013-03-28 |
Charge Pump System Dynamically Reconfigurable For Read And Program
App 20130063118 - Nguyen; Qui Vi ; et al. | 2013-03-14 |
Charge pump systems with reduction in inefficiencies due to charge sharing between capacitances
Grant 8,294,509 - Pan , et al. October 23, 2 | 2012-10-23 |
Charge Pump Systems with Reduction in Inefficiencies Due to Charge Sharing Between Capacitances
App 20120154023 - Pan; Feng ; et al. | 2012-06-21 |
Detection of Word-Line Leakage in Memory Arrays
App 20120008384 - Li; Yan ; et al. | 2012-01-12 |
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