loadpatents
name:-0.028207063674927
name:-0.017478942871094
name:-0.012845039367676
Husemann; Christoph Patent Filings

Husemann; Christoph

Patent Applications and Registrations

Patent applications and USPTO patent grants for Husemann; Christoph.The latest application filed is for "method and device for determining the optimal position of the focal plane for examining a specimen by microscopy".

Company Profile
13.16.24
  • Husemann; Christoph - Jena DE
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Method and devices for displaying stereoscopic images
Grant 11,442,263 - Husemann , et al. September 13, 2
2022-09-13
Method And Device For Determining The Optimal Position Of The Focal Plane For Examining A Specimen By Microscopy
App 20220252856 - STICKER; Markus ;   et al.
2022-08-11
Apparatus And Method For Manipulating A Focus Of Excitation Light On Or In A Sample And Microscope
App 20220155575 - VELLEKOOP; Ivo ;   et al.
2022-05-19
Method for detecting a structure of a lithography mask and device for carrying out the method
Grant 11,079,338 - Matejka , et al. August 3, 2
2021-08-03
Method and device for beam analysis
Grant 11,054,305 - Manger , et al. July 6, 2
2021-07-06
Method And Device For Evaluating A Statistically Distributed Measured Value In The Examination Of An Element Of A Photolithography Process
App 20210158215 - Seidel; Dirk ;   et al.
2021-05-27
Method For Detecting An Object Structure And Apparatus For Carrying Out The Method
App 20210081693 - Mout; Beat Marco ;   et al.
2021-03-18
Method And Apparatus For Evaluating An Unknown Effect Of Defects Of An Element Of A Photolithography Process
App 20210073969 - Freytag; Alexander ;   et al.
2021-03-11
Method And Devices For Displaying Stereoscopic Images
App 20210026126 - HUSEMANN; Christoph ;   et al.
2021-01-28
Method and appliance for predicting the imaging result obtained with a mask when a lithography process is carried out
Grant 10,788,748 - Thaler , et al. September 29, 2
2020-09-29
Determining the position of an object in the beam path of an optical device
Grant 10,670,387 - Stoppe , et al.
2020-06-02
Method for three-dimensionally measuring a 3D aerial image of a lithography mask
Grant 10,634,886 - Matejka , et al.
2020-04-28
Method for generating a reflection-reduced contrast image and corresponding device
Grant 10,620,417 - Stoppe , et al.
2020-04-14
Method and device for beam analysis
Grant 10,605,654 - Manger , et al.
2020-03-31
Method And Device For Beam Analysis
App 20200088571 - Manger; Matthias ;   et al.
2020-03-19
Device And Method For Producing A Three-dimensional Image Of An Object
App 20200082557 - Stoppe; Lars ;   et al.
2020-03-12
Method For Detecting A Structure Of A Lithography Mask And Device For Carrying Out The Method
App 20190391087 - Matejka; Ulrich ;   et al.
2019-12-26
Apparatus And Method For Analyzing An Element Of A Photolithography Process With The Aid Of A Transformation Model
App 20190354019 - Freytag; Alexander ;   et al.
2019-11-21
Method for generating a result image and optical device
Grant 10,475,168 - Stoppe , et al. Nov
2019-11-12
Phase contrast imaging
Grant 10,338,368 - Stoppe , et al.
2019-07-02
Method and device for imaging an object
Grant 10,330,913 - Stoppe , et al.
2019-06-25
Method And Appliance For Predicting The Imaging Result Obtained With A Mask When A Lithography Process Is Carried Out
App 20190107776 - Thaler; Thomas ;   et al.
2019-04-11
Apparatus and method for light modulation
Grant 10,191,292 - Wald , et al. Ja
2019-01-29
Method for generating a contrast image of an object structure and apparatuses relating thereto
Grant 10,175,468 - Stoppe , et al. J
2019-01-08
Method For Three-dimensionally Measuring A 3d Aerial Image Of A Lithography Mask
App 20180357758 - Matejka; Ulrich ;   et al.
2018-12-13
Confocally chromatic sensor for determining coordinates of a measurement object
Grant 10,151,576 - Haverkamp , et al. Dec
2018-12-11
Method For Generating A Reflection-reduced Contrast Image And Corresponding Device
App 20180307024 - STOPPE; Lars ;   et al.
2018-10-25
Method for localizing defects on substrates
Grant 10,108,085 - Peters , et al. October 23, 2
2018-10-23
Method for three-dimensionally measuring a 3D aerial image of a lithography mask
Grant 10,068,325 - Matejka , et al. September 4, 2
2018-09-04
Method And Device For Beam Analysis
App 20180202860 - Manger; Matthias ;   et al.
2018-07-19
Confocally Chromatic Sensor For Determining Coordinates Of A Measurement Object
App 20180135963 - HAVERKAMP; Nils ;   et al.
2018-05-17
Device And Method For Producing A Three-dimensional Image Of An Object
App 20170301101 - Stoppe; Lars ;   et al.
2017-10-19
Phase Contrast Imaging
App 20170276923 - Stoppe; Lars ;   et al.
2017-09-28
Method for Generating a Result Image and Optical Device
App 20170262968 - Stoppe; Lars ;   et al.
2017-09-14
Method and Device for Imaging an Object
App 20170205617 - Stoppe; Lars ;   et al.
2017-07-20
Determining the Position of an Object in the Beam Path of an Optical Device
App 20170167856 - STOPPE; Lars ;   et al.
2017-06-15
Method For Three-dimensionally Measuring A 3d Aerial Image Of A Lithography Mask
App 20170132782 - Matejka; Ulrich ;   et al.
2017-05-11
Method For Localizing Defects On Substrates
App 20170115557 - Peters; Jan Hendrik ;   et al.
2017-04-27
Apparatus and Method for Light Modulation
App 20160377875 - Wald; Matthias ;   et al.
2016-12-29
Method For Generating A Contrast Image Of An Object Structure And Apparatuses Relating Thereto
App 20160320603 - STOPPE; Lars ;   et al.
2016-11-03

uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.

While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.

All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.

© 2024 USPTO.report | Privacy Policy | Resources | RSS Feed of Trademarks | Trademark Filings Twitter Feed