loadpatents
name:-0.0059969425201416
name:-0.0043849945068359
name:-0.002500057220459
Hurd; Trace Patent Filings

Hurd; Trace

Patent Applications and Registrations

Patent applications and USPTO patent grants for Hurd; Trace.The latest application filed is for "system and methods for wafer drying".

Company Profile
2.3.5
  • Hurd; Trace - Austin TX
  • Hurd; Trace - Plano TX
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
System and Methods for Wafer Drying
App 20210287919 - Hurd; Trace ;   et al.
2021-09-16
Etching of silicon nitride and silica deposition control in 3D NAND structures
Grant 10,886,290 - Bassett , et al. January 5, 2
2021-01-05
Aqueous cleaning solution and method of protecting features on a substrate during etch residue removal
Grant 10,844,332 - Toshima , et al. November 24, 2
2020-11-24
Etching Of Silicon Nitride And Silica Deposition Control In 3d Nand Structures
App 20200027891 - Bassett; Derek ;   et al.
2020-01-23
Aqueous Cleaning Solution And Method Of Protecting Features On A Substrate During Etch Residue Removal
App 20190185793 - Toshima; Takayuki ;   et al.
2019-06-20
Atomic Layer Etching Systems And Methods
App 20170345665 - FAGUET; Jacques ;   et al.
2017-11-30
Method for using a modified post-etch clean rinsing agent
Grant 7,732,345 - Matz , et al. June 8, 2
2010-06-08
Method For Using A Modified Post-etch Clean Rinsing Agent
App 20080057730 - Matz; Phillip Daniel ;   et al.
2008-03-06

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