Hunter; Robert O. JR.

Patent Applications and Registrations

Patent applications and USPTO patent grants for Hunter; Robert O. JR..The latest application filed is for "in-situ interferometer arrangement".

Company Profile

0.0.24

Hunter; Robert O. JR. - San Diego CA
Hunter; Robert O. JR. - Snowmass Village CO

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
In-Situ Interferometer Arrangement App 20080007705 - Smith; Adlai H. ; et al.	2008-01-10
Reference Wafer and Process for Manufacturing Same App 20070216902 - Smith; Adlai H. ; et al.	2007-09-20
Systems And Methods For Determination of Focus And Telecentricity, Amelioration of Metrology Induced Effects And Application to Determination Of Precision Bossung Curves App 20070206168 - Smith; Adlai H. ; et al.	2007-09-06
Reference wafer and process for manufacturing same App 20070072091 - Smith; Adlai H. ; et al.	2007-03-29
Apparatus and process for determination of dynamic scan field curvature App 20070024834 - Smith; Adlai H. ; et al.	2007-02-01
Method and apparatus for compensation or amelioration of lens field curvature and other imaging defects by utilizing a multi-wavelength setting illumination source App 20060209410 - Smith; Adlai H. ; et al.	2006-09-21
Method and apparatus for self-referenced wafer stage positional error mapping App 20060209276 - Smith; Adlai H. ; et al.	2006-09-21
Method and apparatus for determination of source polarization matrix App 20060192961 - Smith; Adlai H. ; et al.	2006-08-31
Machine specific and machine group correction of masks based on machine subsystem performance parameters App 20060190915 - Smith; Adlai H. ; et al.	2006-08-24
Method and apparatus for measurement of exit pupil telecentricity and source boresighting App 20060164618 - Smith; Adlai H. ; et al.	2006-07-27
Method and apparatus for self-referenced dynamic step and scan intra-field lens distortion App 20060109438 - Smith; Adlai H. ; et al.	2006-05-25
Method and apparatus for registration with integral alignment optics App 20060042106 - Smith; Adlai H. ; et al.	2006-03-02
Method and apparatus for self-referenced dynamic step and scan intra-field scanning distortion App 20060007431 - Smith; Adlai H. ; et al.	2006-01-12
Process for manufacture of semiconductor chips utilizing a posteriori corrections to machine control system and settings App 20050285056 - Smith, Adlai H. ; et al.	2005-12-29
In-situ interferometer arrangement App 20050264783 - Smith, Adlai H. ; et al.	2005-12-01
Process for amelioration of scanning synchronization error App 20050254027 - Smith, Adlai H. ; et al.	2005-11-17
Apparatus and process for the determination of static lens field curvature App 20050254040 - Smith, Adlai H. ; et al.	2005-11-17
Apparatus and process for determination of dynamic lens field curvature App 20050243309 - Smith, Adlai H. ; et al.	2005-11-03
Apparatus and process for determination of dynamic scan field curvature App 20050243294 - Smith, Adlai H. ; et al.	2005-11-03
Method of emulation of lithographic projection tools App 20050240895 - Smith, Adlai H. ; et al.	2005-10-27
In-situ interferometer arrangement App 20050237541 - Smith, Adlai H. ; et al.	2005-10-27
Method and apparatus for measurement of exit pupil transmittance App 20050237512 - Smith, Adlai H. ; et al.	2005-10-27
Apparatus and method for high resolution in-situ illumination source measurement in projection imaging systems App 20050231705 - Smith, Adlai H. ; et al.	2005-10-20
Process for determination of optimized exposure conditions for transverse distortion mapping App 20050202328 - Smith, Adlai H. ; et al.	2005-09-15

uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.

While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.

All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.