Hunter; Reginald

Patent Applications and Registrations

Patent applications and USPTO patent grants for Hunter; Reginald.The latest application filed is for "method and apparatus for substrate imaging".

Company Profile

0.18.12

Hunter; Reginald - Round Rock TX

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Method and apparatus for substrate imaging Grant 7,969,465 - Batson , et al. June 28, 2	2011-06-28
Sensor device for non-intrusive diagnosis of a semiconductor processing system Grant 7,434,485 - Hunter October 14, 2	2008-10-14
Sensor device for non-intrusive diagnosis of a semiconductor processing system Grant 7,331,250 - Hunter February 19, 2	2008-02-19
Method And Apparatus For Substrate Imaging App 20070085905 - Batson; Don T. ; et al.	2007-04-19
Sensor Device For Non-intrusive Diagnosis Of A Semiconductor Processing System App 20070022832 - Hunter; Reginald	2007-02-01
Sensor Device For Non-intrusive Diagnosis Of A Semiconductor Processing System App 20060236793 - Hunter; Reginald	2006-10-26
Method and apparatus to provide for automated process verification and hierarchical substrate examination Grant 7,012,684 - Hunter March 14, 2	2006-03-14
Sensor device for non-intrusive diagnosis of a semiconductor processing system App 20050126315 - Hunter, Reginald	2005-06-16
Sensor device for non-intrusive diagnosis of a semiconductor processing system Grant 6,895,831 - Hunter May 24, 2	2005-05-24
Methods for continuous embedded process monitoring and optical inspection of substrates using specular signature analysis Grant 6,882,416 - Hunter , et al. April 19, 2	2005-04-19
Method for enhancing substrate processing Grant 6,878,636 - Bailey , et al. April 12, 2	2005-04-12
Method and apparatus for enhanced embedded substrate inspection through process data collection and substrate imaging techniques Grant 6,813,032 - Hunter November 2, 2	2004-11-02
Method and apparatus to provide embedded substrate process monitoring through consolidation of multiple process inspection techniques Grant 6,721,045 - Hunter April 13, 2	2004-04-13
Particle detection and embedded vision system to enhance substrate yield and throughput Grant 6,707,544 - Hunter , et al. March 16, 2	2004-03-16
Optical signal routing method and apparatus providing multiple inspection collection points on semiconductor manufacturing systems Grant 6,707,545 - Hunter March 16, 2	2004-03-16
Particle detection and embedded vision system to enhance substrate yield and throughput Grant 6,697,517 - Hunter February 24, 2	2004-02-24
Method and apparatus for substrate surface inspection using spectral profiling techniques Grant 6,693,708 - Hunter February 17, 2	2004-02-17
Method for confirming alignment of a substrate support mechanism in a semiconductor processing system Grant 6,677,166 - Hunter January 13, 2	2004-01-13
Sensor device for non-intrusive diagnosis of a semiconductor processing system App 20030209097 - Hunter, Reginald	2003-11-13
Movable wireless sensor device for performing diagnostics with a substrate processing system Grant 6,642,853 - Hunter November 4, 2	2003-11-04
Method and apparatus for embedded substrate and system status monitoring Grant 6,630,995 - Hunter October 7, 2	2003-10-07
Method for removing contamination particles from substrate processing chambers App 20030037800 - Bailey, Joel Brad ; et al.	2003-02-27
Method for enhancing substrate processing App 20030040193 - Bailey, Joel Brad ; et al.	2003-02-27
Method for increasing the efficiency of substrate processing chamber contamination detection App 20030037801 - Bailey, Joel Brad ; et al.	2003-02-27
Method and apparatus for substrate imaging App 20020196336 - Batson, Don T. ; et al.	2002-12-26
Method for sensing conditions within a substrate processing system Grant 6,468,816 - Hunter October 22, 2	2002-10-22
Method for confirming alignment of a substrate support mechanism in a semiconductor processing system App 20020092369 - Hunter, Reginald	2002-07-18
Method for confirming alignment of a substrate support mechanism in a semiconductor processing system App 20020078770 - Hunter, Reginald	2002-06-27
Sensor device for non-intrusive diagnosis of a semiconductor processing system App 20010042414 - Hunter, Reginald	2001-11-22
Sensor device for non-intrusive diagnosis of a semiconductor processing system Grant 6,244,121 - Hunter June 12, 2	2001-06-12

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