| Patent | Date |
|---|
In-memory computing using a static random-access memory (SRAM)
Grant 11,430,505 - Patil , et al. August 30, 2 | 2022-08-30 |
Voltage power switch
Grant 11,418,195 - Hunt-Schroeder , et al. August 16, 2 | 2022-08-16 |
Customer-transparent logic redundancy for improved yield
Grant 11,293,980 - Arsovski , et al. April 5, 2 | 2022-04-05 |
Cascaded Sensing Circuits For Detecting And Monitoring Cracks In An Integrated Circuit
App 20220057445 - Polomoff; Nicholas A. ; et al. | 2022-02-24 |
Cascaded sensing circuits for detecting and monitoring cracks in an integrated circuit
Grant 11,215,661 - Polomoff , et al. January 4, 2 | 2022-01-04 |
Cascaded Sensing Circuits For Detecting And Monitoring Cracks In An Integrated Circuit
App 20210356514 - Polomoff; Nicholas A. ; et al. | 2021-11-18 |
In-memory Computing Using A Static Random-access Memory (sram)
App 20210327495 - PATIL; Akhilesh ; et al. | 2021-10-21 |
High-density high-bandwidth static random access memory (SRAM) with phase shifted sequential read
Grant 11,114,155 - Arsovski , et al. September 7, 2 | 2021-09-07 |
Crack detecting and monitoring system for an integrated circuit
Grant 11,105,846 - Polomoff , et al. August 31, 2 | 2021-08-31 |
Sensing circuits for charge trap transistors
Grant 11,101,010 - Hunt-Schroeder , et al. August 24, 2 | 2021-08-24 |
Customer-transparent Logic Redundancy For Improved Yield
App 20210116498 - ARSOVSKI; Igor ; et al. | 2021-04-22 |
Charge pump circuit with internal pre-charge configuration
Grant 10,971,996 - Hunt-Schroeder , et al. April 6, 2 | 2021-04-06 |
Customer-transparent logic redundancy for improved yield
Grant 10,955,474 - Arsovski , et al. March 23, 2 | 2021-03-23 |
Sensing Circuits For Charge Trap Transistors
App 20210082532 - HUNT-SCHROEDER; Eric D. ; et al. | 2021-03-18 |
Zero test time memory using background built-in self-test
Grant 10,839,931 - Arsovski , et al. November 17, 2 | 2020-11-17 |
Sequential read mode static random access memory (SRAM)
Grant 10,796,750 - Arsovski , et al. October 6, 2 | 2020-10-06 |
Charge Pump Circuit With Internal Pre-charge Configuration
App 20200295653 - HUNT-SCHROEDER; Eric D. ; et al. | 2020-09-17 |
IC structure with interdigitated conductive elements between metal guard structures
Grant 10,770,407 - Wu , et al. Sep | 2020-09-08 |
High-density High-bandwidth Static Random Access Memory (sram) With Phase Shifted Sequential Read
App 20200243130 - ARSOVSKI; Igor ; et al. | 2020-07-30 |
Ic Structure With Interdigitated Conductive Elements Between Metal Guard Structures
App 20200219826 - Wu; Zhuojie ; et al. | 2020-07-09 |
Ultra-low voltage level shifter
Grant 10,707,845 - Hunt-Schroeder , et al. | 2020-07-07 |
Ultra-low Voltage Level Shifter
App 20200153418 - HUNT-SCHROEDER; Eric D. ; et al. | 2020-05-14 |
Customer-transparent Logic Redundancy For Improved Yield
App 20200072902 - ARSOVSKI; Igor ; et al. | 2020-03-05 |
Customer-transparent logic redundancy for improved yield
Grant 10,551,436 - Arsovski , et al. Fe | 2020-02-04 |
Sequential Read Mode Static Random Access Memory (sram)
App 20200020388 - Arsovski; Igor ; et al. | 2020-01-16 |
Latching current sensing amplifier for memory array
Grant 10,535,379 - Anand , et al. Ja | 2020-01-14 |
Zero Test Time Memory Using Background Built-in Self-test
App 20190348137 - ARSOVSKI; Igor ; et al. | 2019-11-14 |
Zero test time memory using background built-in self-test
Grant 10,438,678 - Arsovski , et al. O | 2019-10-08 |
Margin test for multiple-time programmable memory (MTPM) with split wordlines
Grant 10,395,752 - Fifield , et al. A | 2019-08-27 |
Margin Test For Multiple-time Programmable Memory (mtpm) With Split Wordlines
App 20190108894 - FIFIELD; John A. ; et al. | 2019-04-11 |
Circuit and method for detecting time dependent dielectric breakdown (TDDB) shorts and signal-margin testing
Grant 10,163,526 - Fifield , et al. Dec | 2018-12-25 |
Zero Test Time Memory Using Background Built-in Self-test
App 20180286491 - ARSOVSKI; Igor ; et al. | 2018-10-04 |
Parallel programming of one time programmable memory array for reduced test time
Grant 10,062,445 - Hunt-Schroeder , et al. August 28, 2 | 2018-08-28 |
Circuit And Method For Detecting Time Dependent Dielectric Breakdown (tddb) Shorts And Signal-margin Testing
App 20180233216 - FIFIELD; John A. ; et al. | 2018-08-16 |
Word line voltage generator for calculating optimum word line voltage level for programmable memory array
Grant 10,026,494 - Fifield , et al. July 17, 2 | 2018-07-17 |
Static random access memory (SRAM) write assist circuit with improved boost
Grant 10,020,047 - Hunt-Schroeder , et al. July 10, 2 | 2018-07-10 |
Parallel Programming Of One Time Programmable Memory Array For Reduced Test Time
App 20180158532 - HUNT-SCHROEDER; Eric D. ; et al. | 2018-06-07 |
Environmentally aware mobile computing devices
Grant 9,967,825 - Hunt-Schroeder , et al. May 8, 2 | 2018-05-08 |
Circuit and method for detecting time dependent dielectric breakdown (TDDB) shorts and signal-margin testing
Grant 9,953,727 - Fifield , et al. April 24, 2 | 2018-04-24 |
Word Line Voltage Generator For Programmable Memory Array
App 20180075921 - FIFIELD; John A. ; et al. | 2018-03-15 |
Double bandwidth algorithmic memory array
Grant 9,870,163 - Arsovski , et al. January 16, 2 | 2018-01-16 |
Customer-transparent Logic Redundancy For Improved Yield
App 20170370990 - ARSOVSKI; Igor ; et al. | 2017-12-28 |
Latching Current Sensing Amplifier For Memory Array
App 20170365302 - ANAND; Darren L. ; et al. | 2017-12-21 |
Word line voltage generator for programmable memory array
Grant 9,837,168 - Fifield , et al. December 5, 2 | 2017-12-05 |
Double Bandwidth Algorithmic Memory Array
App 20170315738 - Arsovski; Igor ; et al. | 2017-11-02 |
Customer-transparent logic redundancy for improved yield
Grant 9,791,507 - Arsovski , et al. October 17, 2 | 2017-10-17 |
Latching current sensing amplifier for memory array
Grant 9,779,783 - Anand , et al. October 3, 2 | 2017-10-03 |
Static Random Access Memory (sram) Write Assist Circuit With Improved Boost
App 20170270999 - HUNT-SCHROEDER; Eric D. ; et al. | 2017-09-21 |
Application specific integrated circuit (ASIC) test screens and selection of such screens
Grant 9,760,673 - Hunt-Schroeder , et al. September 12, 2 | 2017-09-12 |
Application specific integrated circuit (ASIC) test screens and selection of such screens
App 20170220727 - Hunt-Schroeder; Eric D. ; et al. | 2017-08-03 |
Environmentally Aware Mobile Computing Devices
App 20170208544 - Hunt-Schroeder; Eric D. ; et al. | 2017-07-20 |
Operational amplifier with current-controlled up or down hysteresis
Grant 9,654,086 - Fifield , et al. May 16, 2 | 2017-05-16 |
Latching Current Sensing Amplifier For Memory Array
App 20160372164 - ANAND; Darren L. ; et al. | 2016-12-22 |
Voltage-aware adaptive static random access memory (SRAM) write assist circuit
Grant 9,508,420 - Hunt-Schroeder , et al. November 29, 2 | 2016-11-29 |
Customer-transparent Logic Redundancy For Improved Yield
App 20160131706 - ARSOVSKI; Igor ; et al. | 2016-05-12 |
Customer-transparent logic redundancy for improved yield
Grant 9,274,171 - Arsovski , et al. March 1, 2 | 2016-03-01 |
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