Hung; Hui-Chuan
Patent Applications and Registrations
Patent applications and USPTO patent grants for Hung; Hui-Chuan.The latest application filed is for "electrical bias electrical test apparatus and method".
- Hung; Hui-Chuan - Taichung TW
- Hung, Hui-Chuan - Taichung City TW
- Hung; Hui-Chuan - Chu-Pei TW
| Patent | Date |
|---|---|
| Electrical bias electrical test apparatus and method Grant 7,224,173 - Hung May 29, 2 | 2007-05-29 |
| In-situ electron beam induced current detection Grant 6,897,665 - Hung May 24, 2 | 2005-05-24 |
| Electrical bias electrical test apparatus and method App 20050073331 - Hung, Hui-Chuan | 2005-04-07 |
| In-situ Electron Beam Induced Current Detection App 20050052192 - Hung, Hui-Chuan | 2005-03-10 |
| Method for locating weak circuit having insufficient driving current in IC chips Grant 6,294,918 - Hung September 25, 2 | 2001-09-25 |
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