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name:-0.010518074035645
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Hung; Chien-Yao Patent Filings

Hung; Chien-Yao

Patent Applications and Registrations

Patent applications and USPTO patent grants for Hung; Chien-Yao.The latest application filed is for "probe card for testing wafer".

Company Profile
0.10.8
  • Hung; Chien-Yao - Hsin-Chu TW
  • HUNG; Chien-Yao - Chu-Pei TW
  • Hung; Chien-Yao - Hsinchu TW
  • HUNG; CHIEN-YAO - HSINCHU CITY TW
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Probe card structure
Grant 10,247,756 - Hung
2019-04-02
Probe card for testing wafers with fine pitch circuit
Grant 9,970,961 - Hung May 15, 2
2018-05-15
Printed circuit board of probe card
Grant 9,521,750 - Hung December 13, 2
2016-12-13
Probe Card For Testing Wafer
App 20160327591 - HUNG; Chien-Yao
2016-11-10
Probe Card Structure
App 20160305982 - HUNG; Chien-Yao
2016-10-20
Probe card for testing wafers
Grant 9,423,423 - Hung August 23, 2
2016-08-23
Printed circuit board structure
Grant 9,408,293 - Hung August 2, 2
2016-08-02
Test probe card structure
Grant 9,279,853 - Hung , et al. March 8, 2
2016-03-08
Printed Circuit Board Structure
App 20150342021 - HUNG; Chien-Yao
2015-11-26
Printed Circuit Board Of Probe Card
App 20150334835 - HUNG; Chien-Yao
2015-11-19
Test Probe Card Structure
App 20140340109 - HUNG; CHIEN-YAO ;   et al.
2014-11-20
Probe card structure adaptable to different test apparatuses of different specifications
Grant 8,829,936 - Hung , et al. September 9, 2
2014-09-09
Probe Card For Circuit-testing
App 20140091827 - HUNG; Chien-Yao
2014-04-03
CMOS image sensor test probe card
Grant 8,358,146 - Hung January 22, 2
2013-01-22
Probe Card Structure Adaptable To Different Test Apparatuses Of Different Specifications
App 20120049878 - HUNG; CHIEN-YAO ;   et al.
2012-03-01
CIS Circuit Test Probe Card
App 20100127722 - Hung; Chien-Yao
2010-05-27

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