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Patent applications and USPTO patent grants for Hung; Chien-Yao.The latest application filed is for "probe card for testing wafer".
Patent | Date |
---|---|
Probe card structure Grant 10,247,756 - Hung | 2019-04-02 |
Probe card for testing wafers with fine pitch circuit Grant 9,970,961 - Hung May 15, 2 | 2018-05-15 |
Printed circuit board of probe card Grant 9,521,750 - Hung December 13, 2 | 2016-12-13 |
Probe Card For Testing Wafer App 20160327591 - HUNG; Chien-Yao | 2016-11-10 |
Probe Card Structure App 20160305982 - HUNG; Chien-Yao | 2016-10-20 |
Probe card for testing wafers Grant 9,423,423 - Hung August 23, 2 | 2016-08-23 |
Printed circuit board structure Grant 9,408,293 - Hung August 2, 2 | 2016-08-02 |
Test probe card structure Grant 9,279,853 - Hung , et al. March 8, 2 | 2016-03-08 |
Printed Circuit Board Structure App 20150342021 - HUNG; Chien-Yao | 2015-11-26 |
Printed Circuit Board Of Probe Card App 20150334835 - HUNG; Chien-Yao | 2015-11-19 |
Test Probe Card Structure App 20140340109 - HUNG; CHIEN-YAO ;   et al. | 2014-11-20 |
Probe card structure adaptable to different test apparatuses of different specifications Grant 8,829,936 - Hung , et al. September 9, 2 | 2014-09-09 |
Probe Card For Circuit-testing App 20140091827 - HUNG; Chien-Yao | 2014-04-03 |
CMOS image sensor test probe card Grant 8,358,146 - Hung January 22, 2 | 2013-01-22 |
Probe Card Structure Adaptable To Different Test Apparatuses Of Different Specifications App 20120049878 - HUNG; CHIEN-YAO ;   et al. | 2012-03-01 |
CIS Circuit Test Probe Card App 20100127722 - Hung; Chien-Yao | 2010-05-27 |
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