HUNG; AI-JEN

Patent Applications and Registrations

Patent applications and USPTO patent grants for HUNG; AI-JEN.The latest application filed is for "lithographic overlay correction and lithographic process".

Company Profile

3.4.5

HUNG; AI-JEN - NANTOU COUNTY TW
Hung; Ai-Jen - Zhushan Township TW

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Lithographic Overlay Correction And Lithographic Process App 20210041792 - HUNG; AI-JEN ; et al.	2021-02-11
Lithographic overlay correction and lithographic process Grant 10,831,110 - Hung , et al. November 10, 2	2020-11-10
Lithographic Overlay Correction And Lithographic Process App 20190369504 - HUNG; AI-JEN ; et al.	2019-12-05
Method of lithography process with inserting scattering bars Grant 9,805,154 - Ho , et al. October 31, 2	2017-10-31
Intra-field process control for lithography Grant 9,733,577 - Hung , et al. August 15, 2	2017-08-15
Intra-field Process Control For Lithography App 20170068169 - Hung; Ai-Jen ; et al.	2017-03-09
Calibration apparatus and an adjustment method for a lithography apparatus Grant 9,588,446 - Huang , et al. March 7, 2	2017-03-07
Calibration Apparatus And An Adjustment Method For A Lithography Apparatus App 20160349633 - HUANG; Chen-Yen ; et al.	2016-12-01
Method of Lithography Process with Inserting Scattering Bars App 20160335385 - Ho; Irene ; et al.	2016-11-17

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